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RN2308(TE85L,F) PDF预览

RN2308(TE85L,F)

更新时间: 2024-09-28 21:10:15
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
6页 298K
描述
TRANSISTOR PNP 50V 0.1A SC-70

RN2308(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Active
Reach Compliance Code:unknownFactory Lead Time:16 weeks
风险等级:5.74Base Number Matches:1

RN2308(TE85L,F) 数据手册

 浏览型号RN2308(TE85L,F)的Datasheet PDF文件第2页浏览型号RN2308(TE85L,F)的Datasheet PDF文件第3页浏览型号RN2308(TE85L,F)的Datasheet PDF文件第4页浏览型号RN2308(TE85L,F)的Datasheet PDF文件第5页浏览型号RN2308(TE85L,F)的Datasheet PDF文件第6页 
RN2307~RN2309  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN2307, RN2308, RN2309  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN1307 to RN1309  
Equivalent Circuit  
Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN2307  
RN2308  
RN2309  
10  
22  
47  
47  
47  
22  
JEDEC  
JEITA  
SC-70  
2-2E1A  
TOSHIBA  
Weight: 0.006 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
Collector-emitter voltage  
RN2307  
RN2308  
RN2309  
6  
Emitter-base voltage  
V
V
7  
EBO  
15  
Collector current  
I
100  
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
T
150  
j
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
1988-04  
1
2014-03-01  

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