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RN2301(TE85L) PDF预览

RN2301(TE85L)

更新时间: 2024-11-20 20:47:23
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
7页 449K
描述
TRANSISTOR 100 mA, 50 V, PNP, Si, SMALL SIGNAL TRANSISTOR, 2-2E1A, SC-70, 3 PIN, BIP General Purpose Small Signal

RN2301(TE85L) 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:SC-70包装说明:SMALL OUTLINE, R-PDSO-G3
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.21.00.75
风险等级:5.86其他特性:BUILT-IN BIAS RESISTOR RATIO IS 1
最大集电极电流 (IC):0.1 A集电极-发射极最大电压:50 V
配置:SINGLE WITH BUILT-IN RESISTOR最小直流电流增益 (hFE):30
JESD-30 代码:R-PDSO-G3元件数量:1
端子数量:3封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:PNP认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:DUAL晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):200 MHz
Base Number Matches:1

RN2301(TE85L) 数据手册

 浏览型号RN2301(TE85L)的Datasheet PDF文件第2页浏览型号RN2301(TE85L)的Datasheet PDF文件第3页浏览型号RN2301(TE85L)的Datasheet PDF文件第4页浏览型号RN2301(TE85L)的Datasheet PDF文件第5页浏览型号RN2301(TE85L)的Datasheet PDF文件第6页浏览型号RN2301(TE85L)的Datasheet PDF文件第7页 
RN2301~RN2306  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)  
RN2301,RN2302,RN2303  
RN2304,RN2305,RN2306  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit and  
Driver Circuit Applications  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN1301to1306  
Equivalent Circuit  
Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN2301  
RN2302  
RN2303  
RN2304  
RN2305  
RN2306  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
22  
USM  
47  
2.2  
4.7  
JEDEC  
JEITA  
SC-70  
TOSHIBA  
Weight: 0.006g  
2-2E1A  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
10  
5  
V
V
CBO  
CEO  
RN2301~2306  
Collector-emitter voltage  
RN2301~2304  
RN2305, 2306  
Emitter-base voltage  
V
V
EBO  
Collector current  
I
100  
100  
150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN2301~2306  
T
j
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2009-03-16  

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