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PF48F5000M0Y3C0

更新时间: 2023-08-15 00:00:00
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英特尔 - INTEL /
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Memory IC

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Intel StrataFlash® Cellular Memory (M18)  
7.4  
Program and Erase Characteristics  
The M18 device includes specifications for different lithographies, densities, and  
frequencies. For additional information on combinations, see Table 4, “M18 Product  
Litho/Density/Frequency Combinations” on page 8 in the Section 2.0, “Functional  
Description.  
Table 24.  
Program-Erase Characteristics  
V
PPL/VPPH  
Nbr.  
Symbol  
Parameter  
Unit Notes  
Density  
(Mbit)  
Litho (nm)  
Min  
Typ  
Max  
Conventional Word Programming  
Single word (first  
115  
50  
230  
230  
word)  
Program  
Time  
W200  
tPROG/W  
µs  
1,2  
Single word  
(subsequent word)  
Buffered Programming  
W200  
tPROG/W  
Single word  
250  
500  
4.3  
µs  
90  
256, 512  
2.15  
Program  
Time  
1
One Buffer (512  
words)  
W250  
tPROG/PB  
65  
65  
128, 256, 512  
1,024  
1.02  
1.64  
2.05  
3.3  
ms  
Buffered Enhanced Factory Programming  
90  
65  
256, 512  
4.2  
2.0  
W451  
tBEFP/W  
Single word  
128, 256, 512  
5
1,3,4  
1
Program  
Time  
µs  
65  
1,024  
3.2  
tBEFP/  
Setup  
W452  
Buffered EFP Setup  
Erasing and Suspending  
Erase  
Time  
128-Kword Main  
Array Block  
W501  
tERS/MAB  
0.9  
4
s
1
W600  
W601  
tSUSP/P  
tSUSP/E  
Program suspend  
Erase suspend  
20  
20  
30  
30  
1
1
Suspend  
Latency  
µs  
Blank Check  
Blank  
Check  
W702  
tBC/MB  
Main array block  
3.2  
ms  
1
Notes:  
1.  
Typical values measured at TC = +25 °C and nominal voltages. Performance numbers are valid for all speed versions.  
Sampled, but not 100% tested.  
2.  
3.  
4.  
First and subsequent words refer to first word and subsequent words in Control Mode programming region.  
Averaged over entire device.  
BEFP not validated at VPPL  
.
Intel StrataFlash® Cellular Memory (M18)  
July 2007  
Document Number: 309823-009US  
DS  
63  

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