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MT58V512V36DF-7.5 PDF预览

MT58V512V36DF-7.5

更新时间: 2024-11-07 15:45:03
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器内存集成电路
页数 文件大小 规格书
34页 521K
描述
Cache SRAM, 512KX36, 4ns, CMOS, PBGA165, 13 X 15 MM, FBGA-165

MT58V512V36DF-7.5 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:TBGA,针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.63
最长访问时间:4 ns其他特性:PIPELINED ARCHITECTURE
JESD-30 代码:R-PBGA-B165JESD-609代码:e0
长度:15 mm内存密度:18874368 bit
内存集成电路类型:CACHE SRAM内存宽度:36
湿度敏感等级:3功能数量:1
端子数量:165字数:524288 words
字数代码:512000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:512KX36封装主体材料:PLASTIC/EPOXY
封装代码:TBGA封装形状:RECTANGULAR
封装形式:GRID ARRAY, THIN PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):220认证状态:Not Qualified
座面最大高度:1.2 mm最大供电电压 (Vsup):2.625 V
最小供电电压 (Vsup):2.375 V标称供电电压 (Vsup):2.5 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:TIN LEAD
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:13 mmBase Number Matches:1

MT58V512V36DF-7.5 数据手册

 浏览型号MT58V512V36DF-7.5的Datasheet PDF文件第2页浏览型号MT58V512V36DF-7.5的Datasheet PDF文件第3页浏览型号MT58V512V36DF-7.5的Datasheet PDF文件第4页浏览型号MT58V512V36DF-7.5的Datasheet PDF文件第5页浏览型号MT58V512V36DF-7.5的Datasheet PDF文件第6页浏览型号MT58V512V36DF-7.5的Datasheet PDF文件第7页 
18Mb: 1 MEG x 18, 512K x 32/36  
PIPELINED, DCD SYNCBURST SRAM  
MT58L1MY18D, MT58V1MV18D,  
MT58L512Y32D, MT58V512V32D,  
MT58L512Y36D, MT58V512V36D  
3.3V VDD, 3.3V or 2.5V I/O; 2.5V VDD, 2.5V I/O  
18Mb SYNCBURST™  
SRAM  
Features  
Fast clock and OE# access times  
Figure 1: 100-Pin TQFP  
JEDEC-Standard MS-026 BHA (LQFP)  
Single 3.3V ±± ꢀercent or 2.±V ±± ꢀercent ꢀower suꢀꢀly  
Seꢀarate 3.3V ±± ꢀercent or 2.±V ±± ꢀercent isolated  
outꢀut buffer suꢀꢀly (VDDQ)  
SNOOZE MODE for reduced-ꢀower standby  
Common data inꢀuts and data outꢀuts  
Individual byte write control and global write  
Three chiꢀ enables for simꢀle deꢀth exꢀansion and  
address ꢀiꢀelining  
Clock-controlled and registered addresses, data  
I/Os, and control signals  
Internally self-timed WRITE cycle  
Burst control (interleaved or linear burst)  
Low caꢀacitive bus loading  
TQFP  
Options  
Marking  
Timing (Access/Cycle/MHz)  
Figure 2: 165-Ball FBGA  
JEDEC-Standard MO-216 (Var. CAB-1)  
3.1ns/±ns/200 MHz  
3.±ns/6ns/166 MHz  
4.2ns/7.±ns/133 MHz  
±ns/10ns/100 MHz  
-±  
-6  
-7.±  
-10  
Configurations  
3.3V VDD, 3.3V or 2.±V I/O  
1 Meg x 18  
±12K x 32  
±12K x 36  
MT±8L1MY18D  
MT±8L±12Y32D  
MT±8L±12Y36D  
2.±V VDD, 2.±V I/O  
1 Meg x 18  
±12K x 32  
±12K x 36  
MT±8V1MV18D  
MT±8V±12V32D  
MT±8V±12V36D  
Part Number Example:  
MT58L512Y36DT-10  
Packages  
100-ꢀin TQFP  
16±-ball, 13mm x 1±mm FBGA  
T
General Description  
F1  
The Micron® SyncBurstSRAM family emꢀloys  
high-sꢀeed, low-ꢀower CMOS designs that are fabri-  
cated using an advanced CMOS ꢀrocess.  
Oꢀerating Temꢀerature Range  
Commercial (0ºC ? TA ? +70ºC  
Industrial (-40ºC  
None  
IT2  
Microns 18Mb SyncBurst SRAMs integrate a 1 Meg x  
18, ±12K x 32, or ±12K x 36 SRAM core with advanced  
synchronous ꢀeriꢀheral circuitry and a 2-bit burst  
counter. All synchronous inꢀuts ꢀass through registers  
controlled by a ꢀositive-edge-triggered single-clock  
inꢀut (CLK). The synchronous inꢀuts include all  
addresses, all data inꢀuts, active LOW chiꢀ enable  
?
T
?
+8±ºC)  
A
NOTE:  
1. A Part Marking Guide for the FBGA devices can be found  
on Micron’s Web site—http://www.micron.com/number-  
guide.  
2. Contact factory for availability of Industrial Temperature  
devices.  
18Mb: 1 Meg x 18, 512K x 32/36, Pipelined, DCD SyncBurst SRAM  
MT58L1MY18D_16_D.fm – Rev. D, Pub 2/03  
1
©2003 Micron Technology, Inc.  
PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.  

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