Document Number: MRF7S15100H
Rev. 0, 7/2008
Freescale Semiconductor
Technical Data
RF Power Field Effect Transistors
N-Channel Enhancement-Mode Lateral MOSFETs
MRF7S15100HR3
MRF7S15100HSR3
Designed for CDMA base station applications with frequencies from 1470 to
1510 MHz. Suitable for TDMA, CDMA and multicarrier amplifier applications.
To be used in Class AB and Class C for PCN-PCS/cellular radio and WLL
applications.
• Typical Single-Carrier W-CDMA Performance: VDD = 28 Volts, IDQ
=
600 mA, Pout = 23 Watts Avg., f = 1507.5 MHz, 3GPP Test Model 1,
1510 MHz, 23 W AVG., 28 V
SINGLE W-CDMA
LATERAL N-CHANNEL
RF POWER MOSFETs
64 DPCH with 50% Clipping, Channel Bandwidth = 3.84 MHz, Input Signal
PAR = 7.5 dB @ 0.01% Probability on CCDF.
Power Gain — 19.5 dB
Drain Efficiency — 32%
Device Output Signal PAR — 6.2 dB @ 0.01% Probability on CCDF
ACPR @ 5 MHz Offset — -38 dBc in 3.84 MHz Channel Bandwidth
• Capable of Handling 10:1 VSWR, @ 32 Vdc, 1490 MHz, 100 Watts CW
Output Power
• Typical Pout @ 1 dB Compression Point ' 100 Watts CW
Features
CASE 465-06, STYLE 1
NI-780
• 100% PAR Tested for Guaranteed Output Power Capability
• Characterized with Series Equivalent Large-Signal Impedance Parameters
• Internally Matched for Ease of Use
MRF7S1500HR3
• Integrated ESD Protection
• Greater Negative Gate-Source Voltage Range for Improved Class C
Operation
• Optimized for Doherty Applications
• RoHS Compliant
• In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
CASE 465A-06, STYLE 1
NI-780S
MRF7S1500HSR3
Table 1. Maximum Ratings
Rating
Symbol
Value
-0.5, +65
-6.0, +10
32, +0
Unit
Vdc
Vdc
Vdc
°C
Drain-Source Voltage
Gate-Source Voltage
Operating Voltage
V
DSS
V
GS
DD
V
Storage Temperature Range
Case Operating Temperature
T
stg
- 65 to +150
150
T
°C
C
(1)
Operating Junction Temperature
T
225
°C
J
Table 2. Thermal Characteristics
Characteristic
(2)
Symbol
Value
Unit
Thermal Resistance, Junction to Case
Case Temperature 80°C, 55 W CW
Case Temperature 77°C, 23 W CW
R
θ
JC
°C/W
0.65
0.74
1. Continuous use at maximum temperature will affect MTTF.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
© Freescale Semiconductor, Inc., 2008. All rights reserved.
MRF7S15100HR3 MRF7S15100HSR3
RF Device Data
Freescale Semiconductor
1