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MC14001UB_06 PDF预览

MC14001UB_06

更新时间: 2024-11-04 04:59:35
品牌 Logo 应用领域
安森美 - ONSEMI
页数 文件大小 规格书
7页 147K
描述
UB−Suffix Series CMOS Gates

MC14001UB_06 数据手册

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MC14001UB, MC14011UB  
UB−Suffix Series  
CMOS Gates  
The UB Series logic gates are constructed with P and N channel  
enhancement mode devices in a single monolithic structure  
(Complementary MOS). Their primary use is where low power  
dissipation and/or high noise immunity is desired. The UB set of  
CMOS gates are inverting nonbuffered functions.  
http://onsemi.com  
MARKING  
Features  
DIAGRAMS  
Supply Voltage Range = 3.0 Vdc to 18 Vdc  
Linear and Oscillator Applications  
Capable of Driving Two LowPower TTL Loads or One  
LowPower Schottky TTL Load Over the Rated Temperature Range  
Double Diode Protection on All Inputs  
14  
1
PDIP14  
P SUFFIX  
CASE 646  
MC140xxUBCP  
AWLYYWWG  
PinforPin Replacements for Corresponding CD4000 Series UB  
Suffix Devices  
PbFree Packages are Available  
14  
SOIC14  
D SUFFIX  
CASE 751A  
140xxUG  
AWLYWW  
MAXIMUM RATINGS (Voltages Referenced to V  
)
SS  
1
Symbol  
Parameter  
Value  
Unit  
V
V
DC Supply Voltage Range  
0.5 to +18.0  
DD  
V , V  
Input or Output Voltage Range  
(DC or Transient)  
0.5 to V + 0.5  
V
xx  
A
WL, L  
YY, Y  
= Specific Device Code  
= Assembly Location  
= Wafer Lot  
in out  
DD  
I , I  
in out  
Input or Output Current  
(DC or Transient) per Pin  
±10  
mA  
= Year  
WW, W = Work Week  
= PbFree Package  
G
P
Power Dissipation, per Package  
(Note 1)  
500  
mW  
D
T
Ambient Temperature Range  
Storage Temperature Range  
55 to +125  
65 to +150  
260  
°C  
°C  
°C  
A
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 4 of this data sheet.  
T
stg  
T
Lead Temperature  
L
(8Second Soldering)  
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
Recommended Operating Conditions may affect device reliability.  
1. Temperature Derating:  
Plastic “P and D/DW” Packages: – 7.0 mW/_C From 65_C To 125_C  
This device contains protection circuitry to guard against damage due to high  
static voltages or electric fields. However, precautions must be taken to avoid  
applications of any voltage higher than maximum rated voltages to this  
highimpedance circuit. For proper operation, V and V should be constrained  
in  
out  
to the range V v (V or V ) v V  
.
SS  
in  
out  
DD  
Unused inputs must always be tied to an appropriate logic voltage level  
(e.g., either V or V ). Unused outputs must be left open.  
SS  
DD  
©
Semiconductor Components Industries, LLC, 2006  
1
Publication Order Number:  
October, 2006 Rev. 6  
MC14001UB/D  
 

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