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M65608E PDF预览

M65608E

更新时间: 2022-04-23 23:00:11
品牌 Logo 应用领域
爱特美尔 - ATMEL 静态存储器
页数 文件大小 规格书
15页 337K
描述
Rad. Tolerant 128K x 8 Very Low Power 5V CMOS SRAM

M65608E 数据手册

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M65608E  
AC Parameters  
AC Test Conditions  
Input Pulse Levels:....................................GND to 3.0V  
Input Rise/Fall Times: ...............................5 ns  
Input Timing Reference Levels: ................1.5V  
Output loading IOL/IOH (see Figure 1 and Figure 2)+30 pF  
AC Test Loads Waveforms  
Figure 1  
Figure 2  
Figure 3  
Data Retention Mode  
Atmel CMOS RAM’s are designed with battery backup in mind. Data retention voltage  
and supply current are guaranteed over temperature. The following rules ensure data  
retention:  
1. During data retention chip select CS1 must be held high within VCC to VCC -  
0.2V or, chip select CS2 must be held down within GND to GND +0.2V.  
2. Output Enable (OE) should be held high to keep the RAM outputs high imped-  
ance, minimizing power dissipation.  
3. During power up and power-down transitions CS1 and OE must be kept between  
VCC + 0.3V and 70% of VCC, or with CS2 between GND and GND -0.3V.  
4. The RAM can begin operation > TR ns after VCC reaches the minimum opera-  
tion voltages (4.5V).  
Timing  
6
4151I–AERO–03/04  

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