PRELIMINARY DATA SHEET
LP 6 8 3 6 S OT3 4 3
P ACKAGED MEDIUM P OWER P HEMT
·
FEATURES
¨
¨
¨
¨
0.5 dB Noise Figure at 2 GHz
19 dBm P-1dB 2 GHz, 19 dBm at 6 GHz
20 dB Power Gain at 2 GHz, 10 dB at 6 GHz
70% Power-Added-Efficiency
·
DES CRIP TION AND AP P LICATIONS
The LP6836SOT343 is a packaged AlGaAs/InGaAs/AlGaAs pseudomorphic high electron mobility
transistor (pHEMT) intended for applications requiring medium output power and/or high dynamic
range.
It utilizes a 0.25 mm x 360 mm Schottky barrier gate, defined by electron-beam
photolithography. The LP6836’s active areas are passivated with Si3N4, and the SOT343 (also
known as SC-70) package is ideal for low-cost, high-performance applications that require a surface-
mount package.
The LP6836SOT343 is designed for commercial systems for use in low noise amplifiers and
oscillators operating over the RF and Microwave frequency ranges. The low noise figure makes it
appropriate for use in receivers in MMDS and GPS. This device is also suitable as a driver stage for
WLAN and ISM band spread spectrum applications.
·
ELECTRICAL S P ECIFICATIONS @ TAm b ie n t = 2 5 °C
Parameter
Symbol
IDSS
Test Conditions
Min
80
Typ Max Units
Saturated Drain-Source Current
Power at 1-dB Compression
VDS = 2 V; VGS = 0 V
125
mA
dBm
dB
P-1dB
G-1dB
f=2GHz; VDS = 3 V; IDS = 50% IDSS
f=2GHz; VDS = 3 V; IDS = 50% IDSS
18
19
20
Power Gain at 1-dB
Compression
18
Power-Added Efficiency
PAE
NF
f=2GHz; VDS = 3 V; IDS = 50% IDSS
;
70
%
POUT = 19.5 dBm
Noise Figure
f=2GHz; VDS = 3V; IDS = 25% IDSS
f=2GHz; VDS = 3V; IDS = 50% IDSS
VDS = 2 V; VGS = 0 V
VGS = -5 V
0.5
0.7
100
1
dB
dB
mS
mA
V
Transconductance
Gate-Source Leakage Current
Pinch-Off Voltage
GM
IGSO
VP
75
10
VDS = 2 V; IDS = 2 mA
IGS = 2 mA
-0.25
11
-2.0
Gate-Source Breakdown
Voltage Magnitude
|VBDGS
|
15
16
V
Gate-Drain Breakdown
Voltage Magnitude
|VBDGD
|
IGD = 2 mA
12
V
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Re vis e d : 1/20/01
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