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LMH6628JFQML PDF预览

LMH6628JFQML

更新时间: 2024-11-25 21:54:43
品牌 Logo 应用领域
美国国家半导体 - NSC 运算放大器测试
页数 文件大小 规格书
12页 180K
描述
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019

LMH6628JFQML 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 04/29/03  
Last Update Date: 05/13/03  
Last Major Revision Date:  
MNLMH6628-X-RH REV 0A0  
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP,  
GUARANTEED TO 300k rd(Si) TESTED TO MIL-STD-883,  
METHOD 1019  
General Description  
The National LMH6628 is a high speed dual op amp that offers a traditional voltage  
feedback topology featuring unity-gain stability and slew-enhanced circuitry. The  
LMH6628's low noise and very low harmonic distortion combine to form a very wide dynamic  
range op amp that operates from a single (5 to 12V) or dual (+5V) power supply.  
Each of the LMH6628's closely matched channels provides a 300MHz unity gain bandwidth and  
low input voltage noise density (2nV/SqRtHz). Low 2nd/3rd harmonic distortion (-65/-74dBc  
at 10MHz) makes the LMH6628 a perfect wide dynamic-range amplifier for matched I/Q  
channels.  
With its fast and accurate settling (12ns to 0.1%), the LMH6628 is also an excellent  
choice for wide dynamic range, anti-aliasing filters to buffer the inputs of hi resolution  
analog-to-digital converters. Combining the LMH6628's two tightly matched amplifiers in a  
single package reduces cost and board space for many composite amplifier applications such  
as active filters, differential line drivers/receivers, fast peak detectors and  
instrumentation amplifiers.  
The LMH6628 is fabricated using National's VIP 10 (TM) comlimentary bipolar process.  
Industry Part Number  
NS Part Numbers  
LMH6628  
LMH6628J-QML  
LMH6628J-QMLV  
LMH6628JFQML  
LMH6628JFQMLV  
LMH6628WG-QML  
LMH6628WG-QMLV  
LMH6628WGFQML  
LMH6628WGFQMLV  
Prime Die  
LMH6628A  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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