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K7A403209B-QI25 PDF预览

K7A403209B-QI25

更新时间: 2024-11-15 15:45:23
品牌 Logo 应用领域
三星 - SAMSUNG 时钟静态存储器内存集成电路
页数 文件大小 规格书
18页 506K
描述
Cache SRAM, 128KX32, 2.4ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100

K7A403209B-QI25 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:QFP包装说明:LQFP, QFP100,.63X.87
针数:100Reach Compliance Code:unknown
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.92最长访问时间:2.4 ns
其他特性:PIPELINED ARCHITECTURE最大时钟频率 (fCLK):250 MHz
I/O 类型:COMMONJESD-30 代码:R-PQFP-G100
JESD-609代码:e0长度:20 mm
内存密度:4194304 bit内存集成电路类型:CACHE SRAM
内存宽度:32功能数量:1
端子数量:100字数:131072 words
字数代码:128000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:128KX32输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LQFP
封装等效代码:QFP100,.63X.87封装形状:RECTANGULAR
封装形式:FLATPACK, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:2.5/3.3,3.3 V
认证状态:Not Qualified座面最大高度:1.6 mm
最大待机电流:0.05 A最小待机电流:3.14 V
子类别:SRAMs最大压摆率:0.4 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):3.135 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.65 mm端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:14 mm
Base Number Matches:1

K7A403209B-QI25 数据手册

 浏览型号K7A403209B-QI25的Datasheet PDF文件第2页浏览型号K7A403209B-QI25的Datasheet PDF文件第3页浏览型号K7A403209B-QI25的Datasheet PDF文件第4页浏览型号K7A403209B-QI25的Datasheet PDF文件第5页浏览型号K7A403209B-QI25的Datasheet PDF文件第6页浏览型号K7A403209B-QI25的Datasheet PDF文件第7页 
K7A403609B  
K7A403209B  
K7A401809B  
128Kx36/x32 & 256Kx18 Synchronous SRAM  
Document Title  
128Kx36 & 128Kx32 & 256Kx18-Bit Synchronous Pipelined Burst SRAM  
Revision History  
Remark  
Rev. No  
History  
Draft Date  
Preliminary  
Preliminary  
0.0  
0.1  
1. Initial draft  
May. 15. 2001  
June. 12. 2001  
1. Changed DC parameters  
Icc ; from 570mA to 490mA at -30,  
from 520mA to 440mA at -27,  
from 470mA to 400mA at -25,  
from 440mA to 360mA at -22,  
from 400mA to 330mA at -20,  
from 370mA to 310mA at -18,  
ISB ; from 200mA to 180mA at -30,  
from 190mA to 170mA at -27,  
from 180mA to 160mA at -25,  
from 170mA to 155mA at -22,  
from 160mA to 150mA at -20,  
from 150mA to 140mA at -18,  
ISB1 ; from 100mA to 80mA  
2. Input set-up(tAS,tSS,tDS,tWS,tADVS,tCSS) from 0.6ns to 0.7ns at -30  
Preliminary  
Preliminary  
0.2  
0.3  
1. Delete Pass-Through  
June. 25. 2001  
July. 31. 2001  
1. Changed Input set-up(tAS,tSS,tDS,tWS,tADVS,tCSS)  
- from 0.8ns to 1.0ns at -25  
- from 075ns to 0.8ns at -27  
- from 0.7ns to 0.8ns at -30  
Preliminary  
Final  
0.4  
1.0  
1. Add x32 org and industrial range temperature  
Aug. 11. 2001  
Nov. 15. 2001  
1. Final spec release  
2. Changed Pin Capacitance  
- Cin ; from 5pF to 4pF  
- Cout ; from 7pF to 6pF  
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the  
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-  
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.  
- 1 -  
Nov 2001  
Rev 1.0  

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