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K7A403200M-TC14 PDF预览

K7A403200M-TC14

更新时间: 2024-11-16 04:19:19
品牌 Logo 应用领域
三星 - SAMSUNG 静态存储器
页数 文件大小 规格书
15页 402K
描述
Cache SRAM, 128KX32, 4ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100

K7A403200M-TC14 数据手册

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K7A403200M  
128Kx32 Synchronous SRAM  
Document Title  
128Kx32-Bit Synchronous Pipelined Burst SRAM  
Revision History  
Rev.No.  
History  
Draft Date  
Remark  
1.0  
2.0  
Initial draft  
May . 19. 1998  
June . 02. 1998  
Final  
Final  
change tCYC from 8.5ns to 10.0ns.  
Modify Rev No. from 0.0 to 1.0.  
3.0  
Modify DC characteristics( Input Leakage Current test Conditions)  
form VDD=VSS to VDD to Max.  
June. 08. 1998  
Final  
4.0  
5.0  
Add VDDQ Supply voltage( 2.5V )  
Dec. 02. 1998  
Feb. 10. 1999  
Final  
Final  
Remove 119BGA(7x17 Ball Grid Array Package) .  
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the  
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-  
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.  
- 1 -  
February 1999  
Rev 5.0  

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