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JANTXVR2N7482T3 PDF预览

JANTXVR2N7482T3

更新时间: 2024-01-30 04:44:05
品牌 Logo 应用领域
英飞凌 - INFINEON /
页数 文件大小 规格书
22页 203K
描述
Power Field-Effect Transistor, 18A I(D), 30V, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-257AA, TO-257AA, 3 PIN

JANTXVR2N7482T3 技术参数

生命周期:Active零件包装代码:TO-257AA
包装说明:FLANGE MOUNT, R-XSFM-P3针数:3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.29.00.95风险等级:5.38
其他特性:RADIATION HARDENED雪崩能效等级(Eas):117 mJ
外壳连接:ISOLATED配置:SINGLE
最小漏源击穿电压:30 V最大漏极电流 (ID):18 A
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-257AA
JESD-30 代码:R-XSFM-P3元件数量:1
端子数量:3工作模式:ENHANCEMENT MODE
封装主体材料:UNSPECIFIED封装形状:RECTANGULAR
封装形式:FLANGE MOUNT极性/信道类型:N-CHANNEL
最大脉冲漏极电流 (IDM):72 A认证状态:Qualified
参考标准:MIL-19500/702表面贴装:NO
端子形式:PIN/PEG端子位置:SINGLE
晶体管元件材料:SILICONBase Number Matches:1

JANTXVR2N7482T3 数据手册

 浏览型号JANTXVR2N7482T3的Datasheet PDF文件第1页浏览型号JANTXVR2N7482T3的Datasheet PDF文件第3页浏览型号JANTXVR2N7482T3的Datasheet PDF文件第4页浏览型号JANTXVR2N7482T3的Datasheet PDF文件第5页浏览型号JANTXVR2N7482T3的Datasheet PDF文件第6页浏览型号JANTXVR2N7482T3的Datasheet PDF文件第7页 
MIL-PRF-19500/702C  
1.4 Primary electrical characteristics at TC = +25°C.  
Type  
Min V(BR)DSS  
VGS = 0  
VGS(TH)1  
VDS VGS  
Max IDSS1  
VGS = 0  
VDS = 80 percent of  
rated VDS  
Max rDS(on)  
VGS = 12V, ID = ID2  
(1)  
EAS  
mJ  
ID = 1.0 mA dc  
ID = 1.0mA dc  
TJ = +25°C TJ = +150°C  
V dc  
V dc  
µA dc  
Min  
2.0  
Max  
4.0  
2N7482T3  
2N7483T3  
2N7484T3  
30  
60  
177  
110  
87  
10  
10  
10  
0.030  
0.040  
0.070  
0.060  
0.080  
0.160  
2.0  
2.0  
4.0  
4.0  
100  
(1) Pulsed (see 4.5.1).  
2. APPLICABLE DOCUMENTS  
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This  
section does not include documents cited in other sections of this specification or recommended for additional  
information or as examples. While every effort has been made to ensure the completeness of this list, document  
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this  
specification, whether or not they are listed.  
2.2 Government documents.  
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a  
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are  
those cited in the solicitation or contract.  
DEPARTMENT OF DEFENSE SPECIFICATIONS  
MIL-PRF-19500  
DEPARTMENT OF DEFENSE STANDARDS  
MIL-STD-750 Test Methods for Semiconductor Devices.  
-
Semiconductor Devices, General Specification for.  
-
* (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or  
https://assist.daps.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,  
Philadelphia, PA 19111-5094.)  
2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the  
text of this document and the references cited herein, the text of this document takes precedence. Nothing in this  
document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.  
2

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