128K x 36, 256K x 18
IDT71V35761S
IDT71V35781S
IDT71V35761SA
IDT71V35781SA
3.3VSynchronousSRAMs
3.3VI/O,PipelinedOutputs
BurstCounter,SingleCycleDeselect
Features
Description
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128K x 36, 256K x 18 memory configurations
The IDT71V35761/781 are high-speed SRAMs organized as
128Kx36/256Kx18.TheIDT71V35761/781SRAMscontainwrite,data,
addressandcontrolregisters. InternallogicallowstheSRAMtogenerate
aself-timedwritebaseduponadecisionwhichcanbeleftuntiltheendof
thewritecycle.
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Supports high system speed:
Commercial:
– 200MHz 3.1ns clock access time
CommercialandIndustrial:
– 183MHz 3.3ns clock access time
– 166MHz 3.5ns clock access time
LBO input selects interleaved or linear burst mode
Theburstmodefeatureoffersthehighestlevelofperformancetothe
systemdesigner,astheIDT71V35761/81canprovidefourcyclesofdata
forasingleaddress presentedtotheSRAM. Aninternalburstaddress
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Self-timedwritecyclewithglobalwritecontrol(GW),bytewrite counteracceptsthefirstcycleaddressfromtheprocessor,initiatingthe
enable (BWE), and byte writes (BWx)
3.3V core power supply
Power down controlled by ZZ input
3.3V I/O
accesssequence.Thefirstcycleofoutputdatawillbepipelinedforone
cycle before it is available on the next rising clock edge. If burst mode
operationisselected(ADV=LOW),thesubsequentthreecyclesofoutput
datawillbeavailabletotheuseronthenextthreerisingclockedges. The
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Optional - Boundary Scan JTAG Interface (IEEE 1149.1 orderofthesethreeaddressesaredefinedbytheinternalburstcounter
compliant)
andthe LBO inputpin.
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Packaged in a JEDEC Standard 100-pin plastic thin quad
TheIDT71V35761/781SRAMsutilizeIDT’slatesthigh-performance
flatpack(TQFP),119ballgridarray(BGA)and165finepitchball CMOSprocessandarepackagedinaJEDECstandard14mmx20mm
grid array
100-pin thinplasticquadflatpack(TQFP)aswellasa119ballgridarray
(BGA) and 165 fine pitch ball grid array.
PinDescriptionSummary
A0-A17
Address Inputs
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Input
Input
I/O
Synchronous
Synchronous
Synchronous
Asynchronous
Synchronous
Synchronous
Synchronous
N/A
Chip Enable
CE
CS0, CS1
OE
Chip Selects
Output Enable
Global Write Enable
Byte Write Enable
Individual Byte Write Selects
Clock
GW
BWE
(1)
BW1, BW2, BW3, BW4
CLK
Burst Address Advance
Address Status (Cache Controller)
Address Status (Processor)
Linear / Interleaved Burst Order
Test Mode Select
Test Data Input
Synchronous
Synchronous
Synchronous
DC
ADV
ADSC
ADSP
LBO
TMS
Synchronous
Synchronous
N/A
TDI
TCK
Test Clock
TDO
Test Data Output
Synchronous
Asynchronous
Asynchronous
Synchronous
N/A
JTAG Reset (Optional)
Sleep Mode
TRST
ZZ
I/O0-I/O31, I/OP1-I/OP4
VDD, VDDQ
Data Input / Output
Core Power, I/O Power
Ground
Supply
Supply
VSS
N/A
NOTE:
5301 tbl 01
1. BW3 and BW4 are not applicable for the IDT71V35781.
JUNE 2003
1
©2003IntegratedDeviceTechnology,Inc.
DSC-5301/03