128K x 36, 256K x 18,
IDT71V3557S
IDT71V3559S
IDT71V3557SA
IDT71V3559SA
3.3V Synchronous ZBT™ SRAMs
3.3V I/O, Burst Counter,
Flow-Through Outputs
Features
it read or write.
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128K x 36, 256K x 18 memory configurations
Supports high performance system speed - 100 MHz
(7.5 ns Clock-to-Data Access)
The IDT71V3557/59 contain address, data-in and control signal
registers.Theoutputsareflow-through(nooutputdataregister).Output
enable is the only asynchronous signal and can be used to disable the
outputsatanygiventime.
A Clock Enable (CEN) pin allows operation of the IDT71V3557/59
to be suspended as long as necessary. All synchronous inputs are
ignored when (CEN) is high and the internal device registers will hold
their previous values.
Therearethreechipenablepins(CE1,CE2,CE2)thatallowtheuser
todeselectthedevicewhendesired.Ifanyoneofthesethreeisnotasserted
when ADV/LD is low, no new memory operation can be
initiated. However, any pending data transfers (reads or writes) will
be completed. The data bus will tri-state one cycle after chip is de-
selectedorawriteisinitiated.
The IDT71V3557/59 have an on-chip burst counter. In the burst
mode, the IDT71V3557/59 can provide four cycles of data for a single
address presented to the SRAM. The order of the burst sequence is
defined by the LBO input pin. The LBO pin selects between linear and
interleaved burst sequence. The ADV/LD signal is used to load a new
externaladdress(ADV/LD=LOW)orincrementtheinternalburstcounter
(ADV/LD = HIGH).
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ZBTTM Feature - No dead cycles between write and read
cycles
Internally synchronized output buffer enable eliminates
the need to control OE
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Single R/W (READ/WRITE) control pin
4-word burst capability (Interleaved or linear)
Individual byte write (BW1 - BW4) control (May tie active)
Three chip enables for simple depth expansion
3.3V power supply (±5%), 3.3V (±5%) I/O Supply (VDDQ)
Optional Boundary Scan JTAG Interface (IEEE 1149.1
complaint)
Packaged in a JEDEC Standard 100-pin plastic thin quad
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine
pitch ball grid array (fBGA)
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Description
TheIDT71V3557/59are3.3Vhigh-speed4,718,592-bit(4.5Mega-
bit) synchronous SRAMs organized as 128K x 36/256K x 18. They are
designed to eliminate dead bus cycles when turning the bus around
between reads and writes, or writes and reads. Thus they have been
given the name ZBTTM, or Zero Bus Turnaround.
The IDT71V3557/59 SRAMs utilize IDT's latest high-performance
CMOSprocessandarepackagedinaJEDECstandard14mmx20mm
100-pin thinplasticquadflatpack(TQFP)aswellasa119 ballgridarray
(BGA) and a 165 fine pitch ball grid array (fBGA).
AddressandcontrolsignalsareappliedtotheSRAMduringoneclock
cycle, andonthenextclockcycletheassociateddatacycleoccurs, be
PinDescriptionSummary
A
0-A17
Address Inputs
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Input
Input
I/O
Synchronous
Synchronous
Asynchronous
Synchronous
Synchronous
Synchronous
N/A
Chip Enables
CE1
, CE
2
, CE
2
Output Enable
OE
R/W
Read/Write Signal
Clock Enable
CEN
Individual Byte Write Selects
Clock
BW
1
, BW
2
, BW
3
, BW
4
CLK
ADV/LD
LBO
TMS
TDI
Advance burst address / Load new address
Linear / Interleaved Burst Order
Test Mode Select
Test Data Input
Synchronous
Static
Synchronous
Synchronous
N/A
TCK
TDO
TRST
ZZ
Test Clock
Test Data Output
Synchronous
Asynchronous
Synchronous
Synchronous
Static
JTAG Reset (Optional)
Sleep Mode
I/O
0
-I/O31, I/OP1-I/OP4
Data Input / Output
Core Power, I/O Power
Ground
V
V
DD, VDDQ
SS
Supply
Supply
Static
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FEBRUARY 2009
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©2009 Integrated Device Technology, Inc.
DSC-5282/09