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IDT71V3556S133BGI8 PDF预览

IDT71V3556S133BGI8

更新时间: 2024-11-23 15:41:07
品牌 Logo 应用领域
艾迪悌 - IDT 时钟静态存储器内存集成电路
页数 文件大小 规格书
28页 643K
描述
ZBT SRAM, 128KX36, 4.2ns, CMOS, PBGA119, 14 X 22 MM, PLASTIC, BGA-119

IDT71V3556S133BGI8 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:14 X 22 MM, PLASTIC, BGA-119
针数:119Reach Compliance Code:not_compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.11最长访问时间:4.2 ns
最大时钟频率 (fCLK):133 MHzI/O 类型:COMMON
JESD-30 代码:R-PBGA-B119JESD-609代码:e0
长度:22 mm内存密度:4718592 bit
内存集成电路类型:ZBT SRAM内存宽度:36
湿度敏感等级:3功能数量:1
端子数量:119字数:131072 words
字数代码:128000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:128KX36输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:BGA
封装等效代码:BGA119,7X17,50封装形状:RECTANGULAR
封装形式:GRID ARRAY并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:3.3 V
认证状态:Not Qualified座面最大高度:2.36 mm
最大待机电流:0.045 A最小待机电流:3.14 V
子类别:SRAMs最大压摆率:0.31 mA
最大供电电压 (Vsup):3.465 V最小供电电压 (Vsup):3.135 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn63Pb37)端子形式:BALL
端子节距:1.27 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:14 mm
Base Number Matches:1

IDT71V3556S133BGI8 数据手册

 浏览型号IDT71V3556S133BGI8的Datasheet PDF文件第2页浏览型号IDT71V3556S133BGI8的Datasheet PDF文件第3页浏览型号IDT71V3556S133BGI8的Datasheet PDF文件第4页浏览型号IDT71V3556S133BGI8的Datasheet PDF文件第5页浏览型号IDT71V3556S133BGI8的Datasheet PDF文件第6页浏览型号IDT71V3556S133BGI8的Datasheet PDF文件第7页 
IDT71V3556S/XS  
IDT71V3558S/XS  
IDT71V3556SA/XSA  
IDT71V3558SA/XSA  
128K x 36, 256K x 18  
3.3VSynchronousZBTSRAMs  
3.3V I/O, Burst Counter  
PipelinedOutputs  
Description  
Features  
TheIDT71V3556/58are3.3Vhigh-speed4,718,592-bit(4.5Mega-  
bit) synchronous SRAMS. They are designed to eliminate dead bus  
cycles when turning the bus around between reads and writes, or  
writes and reads. Thus, they have been given the name ZBTTM, or  
Zero Bus Turnaround.  
128K x 36, 256K x 18 memory configurations  
Supports high performance system speed - 200 MHz  
(3.2 ns Clock-to-Data Access)  
ZBTTM Feature - No dead cycles between write and read  
cycles  
Address and control signals are applied to the SRAM during one  
clockcycle,andtwocycleslatertheassociateddatacycleoccurs,beit  
read or write.  
The IDT71V3556/58 contain data I/O, address and control signal  
registers.Outputenableistheonlyasynchronoussignalandcanbeused  
todisabletheoutputsatanygiventime.  
A Clock Enable (CEN) pin allows operation of the IDT71V3556/58  
to be suspended as long as necessary. All synchronous inputs are  
ignored when (CEN) is high and the internal device registers will hold  
their previous values.  
Internally synchronized output buffer enable eliminates the  
need to control OE  
Single R/W (READ/WRITE) control pin  
Positive clock-edge triggered address, data, and control  
signal registers for fully pipelined applications  
4-word burst capability (interleaved or linear)  
Individual byte write (BW1 - BW4) control (May tie active)  
Three chip enables for simple depth expansion  
3.3V power supply (±5%), 3.3V I/O Supply (VDDQ)  
Optional- Boundary Scan JTAG Interface (IEEE 1149.1  
Therearethreechipenablepins(CE1,CE2,CE2)thatallowtheuser  
to deselect the device when desired. If any one of these three are not  
asserted when ADV/LD is low, no new memory operation can be  
initiated. However, any pending data transfers (reads or writes) will be  
completed.Thedatabuswilltri-statetwocyclesafterchipisdeselected  
orawriteisinitiated.  
compliant)  
Packaged in a JEDEC standard 100-pin plastic thin quad  
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch  
ball grid array (fBGA)  
PinDescriptionSummary  
A
0
-A17  
Address Inputs  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Output  
Input  
Input  
I/O  
Synchronous  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Synchronous  
N/A  
Chip Enables  
CE  
1, CE  
2
, CE  
2
Output Enable  
OE  
R/W  
Read/Write Signal  
Clock Enable  
CEN  
Individual Byte Write Selects  
Clock  
BW  
1, BW  
2
, BW  
3
, BW  
4
CLK  
ADV/LD  
LBO  
TMS  
TDI  
Advance burst address / Load new address  
Linear / Interleaved Burst Order  
Test Mode Select  
Test Data Input  
Synchronous  
Static  
Synchronous  
Synchronous  
N/A  
TCK  
Test Clock  
TDO  
TRST  
ZZ  
Test Data Output  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Static  
JTAG Reset (Optional)  
Sleep Mode  
I/O  
0-I/O31, I/OP1-I/OP4  
Data Input / Output  
Core Power, I/O Power  
Ground  
V
V
DD, VDDQ  
SS  
Supply  
Supply  
Static  
5281 tbl 01  
FEBRUARY 2009  
1
©2006IntegratedDeviceTechnology,Inc.  
DSC-5281/09  

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