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IDT71V2578S150BGI8 PDF预览

IDT71V2578S150BGI8

更新时间: 2024-11-22 08:44:59
品牌 Logo 应用领域
艾迪悌 - IDT 静态存储器
页数 文件大小 规格书
22页 620K
描述
Cache SRAM, 256KX18, 3.8ns, CMOS, PBGA119, BGA-119

IDT71V2578S150BGI8 数据手册

 浏览型号IDT71V2578S150BGI8的Datasheet PDF文件第2页浏览型号IDT71V2578S150BGI8的Datasheet PDF文件第3页浏览型号IDT71V2578S150BGI8的Datasheet PDF文件第4页浏览型号IDT71V2578S150BGI8的Datasheet PDF文件第5页浏览型号IDT71V2578S150BGI8的Datasheet PDF文件第6页浏览型号IDT71V2578S150BGI8的Datasheet PDF文件第7页 
128K X 36, 256K X 18  
IDT71V2576S  
IDT71V2578S  
IDT71V2576SA  
IDT71V2578SA  
3.3VSynchronousSRAMs  
2.5V I/O, Pipelined Outputs,  
Burst Counter, Single Cycle Deselect  
Features  
Description  
128K x 36, 256K x 18 memory configurations  
The IDT71V2576/78 are high-speed SRAMs organized as 128K x  
36/256Kx18.TheIDT71V2576/78SRAMscontainwrite,data,address  
andcontrolregisters. InternallogicallowstheSRAMtogenerateaself-  
timedwritebaseduponadecisionwhichcanbeleftuntiltheendofthewrite  
cycle.  
Supports high system speed:  
CommercialandIndustrial:  
– 150MHz 3.8ns clock access time  
– 133MHz 4.2ns clock access time  
LBO input selects interleaved or linear burst mode  
Theburstmodefeatureoffersthehighestlevelofperformancetothe  
Self-timedwritecyclewithglobalwritecontrol(GW),bytewrite systemdesigner,astheIDT71V2576/78canprovidefourcyclesofdata  
enable (BWE), and byte writes (BWx)  
3.3V core power supply  
Power down controlled by ZZ input  
2.5V I/O  
Optional - Boundary Scan JTAG Interface (IEEE 1149.1 operationisselected(ADV=LOW),thesubsequentthreecyclesofoutput  
compliant) datawillbeavailabletotheuseronthenextthreerisingclockedges. The  
Packaged in a JEDEC Standard 100-pin plastic thin quad orderofthesethreeaddressesaredefinedbytheinternalburstcounter  
flatpack(TQFP),119ballgridarray(BGA)and165finepitchball andthe LBO inputpin.  
grid array (fBGA)  
forasingleaddress presentedtotheSRAM. Aninternalburstaddress  
counteracceptsthefirstcycleaddressfromtheprocessor,initiatingthe  
accesssequence.Thefirstcycleofoutputdatawillbepipelinedforone  
cycle before it is available on the next rising clock edge. If burst mode  
The IDT71V2576/78 SRAMs utilize IDT’s latest high-performance  
CMOSprocessandarepackagedinaJEDECstandard14mmx20mm  
100-pinthinplasticquadflatpack(TQFP)aswellasa119 ballgridarray  
(BGA) and 165 fine pitch ball grid array (fBGA).  
PinDescriptionSummary  
A0-A17  
Address Inputs  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Output  
Input  
Input  
I/O  
Synchronous  
Synchronous  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Synchronous  
N/A  
Chip Enable  
CE  
CS  
0
, CS  
1
Chip Selects  
Output Enable  
OE  
GW  
Global Write Enable  
Byte Write Enable  
Individual Byte Write Selects  
Clock  
BWE  
BW , BW  
(1)  
1
2
, BW  
3
, BW  
4
CLK  
Burst Address Advance  
Address Status (Cache Controller)  
Address Status (Processor)  
Linear / Interleaved Burst Order  
Test Mode Select  
Test Data Input  
Synchronous  
Synchronous  
Synchronous  
DC  
ADV  
ADSC  
ADSP  
LBO  
TMS  
TDI  
Synchronous  
Synchronous  
N/A  
TCK  
TDO  
TRST  
ZZ  
Test Clock  
Test Data Output  
Synchronous  
Asynchronous  
Asynchronous  
Synchronous  
N/A  
JTAG Reset (Optional)  
Sleep Mode  
I/O  
0
-I/O31, I/OP1-I/OP4  
DD, VDDQ  
SS  
Data Input / Output  
Core Power, I/O Power  
Ground  
V
Supply  
Supply  
V
N/A  
4876 tbl 01  
NOTE:  
JUNE 2003  
1. BW3 and BW4 are not applicable for the IDT71V2578.  
1
©2003IntegratedDeviceTechnology,Inc.  
DSC-4876/09  

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