512K x 36, 1M x 18
IDT71T75602
IDT71T75802
2.5V Synchronous ZBT™ SRAMs
2.5V I/O, Burst Counter
PipelinedOutputs
Features
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Description
512K x 36, 1M x 18 memory configurations
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The IDT71T75602/802 are 2.5V high-speed 18,874,368-bit
(18 Megabit)synchronousSRAMs.Theyaredesignedtoeliminatedead
bus cycles when turning the bus around between reads and writes, or
Supports high performance system speed - 225 MHz
(3.0 ns Clock-to-Data Access)
ZBTTM Feature - No dead cycles between write and read
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TM
writes andreads.Thus,theyhavebeengiventhenameZBT ,orZero
Bus Turnaround.
cycles
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Internally synchronized output buffer enable eliminates the
Address and control signals are applied to the SRAM during one
clockcycle,andtwocycles latertheassociateddatacycleoccurs,beit
read or write.
need to control OE
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Single R/W (READ/WRITE) control pin
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Positive clock-edge triggered address, data, and control
TheIDT71T75602/802containdataI/O,addressandcontrolsignal
registers.Outputenableistheonlyasynchronoussignalandcanbeused
todisabletheoutputsatanygiventime.
AClockEnable CEN pinallows operationofthe IDT71T75602/802
tobesuspendedaslongasnecessary.Allsynchronousinputsareignored
when(CEN)ishighandtheinternaldeviceregisterswillholdtheirprevious
values.
There are three chip enable pins (CE1, CE2, CE2) that allow the
usertodeselectthedevicewhendesired.Ifanyoneofthesethreeisnot
assertedwhenADV/LDislow,nonewmemoryoperationcanbeinitiated.
signal registers for fully pipelined applications
4-word burst capability (interleaved or linear)
Individual byte write (BW1 - BW4) control (May tie active)
Three chip enables for simple depth expansion
2.5V power supply (±5%)
2.5V I/O Supply (VDDQ)
Power down controlled by ZZ input
Boundary Scan JTAG Interface (IEEE 1149.1 Compliant)
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Packaged in a JEDEC standard 100-pin plastic thin quad
flatpack (TQFP), 119 ball grid array (BGA)
PinDescriptionSummary
A0-A19
Address Inputs
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Input
Input
I/O
Synchronous
Synchronous
Asynchronous
Synchronous
Synchronous
Synchronous
N/A
Chip Enables
CE1, CE2, CE2
OE
Output Enable
W
R/
Read/Write Signal
Clock Enable
CEN
Individual Byte Write Selects
Clock
BW1, BW2, BW3, BW4
CLK
ADV/LD
Advance burst address / Load new address
Linear / Interleaved Burst Order
Test Mode Select
Test Data Input
Synchronous
Static
LBO
TMS
N/A
TDI
N/A
TCK
Test Clock
N/A
TDO
Test Data Input
N/A
JTAG Reset (Optional)
Sleep Mode
Asynchronous
Synchronous
Synchronous
Static
TRST
ZZ
I/O0-I/O31, I/OP1-I/OP4
VDD, VDDQ
Data Input / Output
Core Power, I/O Power
Ground
Supply
Supply
VSS
Static
5313 tbl 01
APRIL 2004
1
©2004IntegratedDeviceTechnology,Inc.
DSC-5313/08