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IC41LV16105-50K PDF预览

IC41LV16105-50K

更新时间: 2024-02-29 07:23:21
品牌 Logo 应用领域
矽成 - ICSI 动态存储器光电二极管内存集成电路
页数 文件大小 规格书
18页 188K
描述
Fast Page DRAM, 1MX16, 50ns, CMOS, PDSO42,

IC41LV16105-50K 技术参数

是否Rohs认证: 不符合生命周期:Transferred
包装说明:SOJ, SOJ42,.44Reach Compliance Code:unknown
风险等级:5.83最长访问时间:50 ns
I/O 类型:COMMONJESD-30 代码:R-PDSO-J42
JESD-609代码:e0内存密度:16777216 bit
内存集成电路类型:FAST PAGE DRAM内存宽度:16
端子数量:42字数:1048576 words
字数代码:1000000最高工作温度:70 °C
最低工作温度:组织:1MX16
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:SOJ封装等效代码:SOJ42,.44
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
电源:3.3 V认证状态:Not Qualified
刷新周期:1024自我刷新:NO
最大待机电流:0.0005 A子类别:DRAMs
最大压摆率:0.16 mA标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:J BEND端子节距:1.27 mm
端子位置:DUALBase Number Matches:1

IC41LV16105-50K 数据手册

 浏览型号IC41LV16105-50K的Datasheet PDF文件第5页浏览型号IC41LV16105-50K的Datasheet PDF文件第6页浏览型号IC41LV16105-50K的Datasheet PDF文件第7页浏览型号IC41LV16105-50K的Datasheet PDF文件第9页浏览型号IC41LV16105-50K的Datasheet PDF文件第10页浏览型号IC41LV16105-50K的Datasheet PDF文件第11页 
IC41C16105  
IC41LV16105  
AC CHARACTERISTICS (Continued)(1,2,3,4,5,6)  
(Recommended Operating Conditions unless otherwise noted.)  
-50  
Min. Max.  
-60  
Min. Max.  
Symbol  
Parameter  
Units  
tACH  
Column-Address Setup Time to CAS  
Precharge during WRITE Cycle  
15  
—
15  
—
ns  
tOEH  
OE Hold Time from WE during  
READ-MODI<Y-WRITE cycle(18)  
8
—
10  
—
ns  
tDS  
Data-In Setup Time(15, 22)  
Data-In Hold Time(15, 22)  
0
8
—
—
—
—
0
—
—
—
—
ns  
ns  
ns  
ns  
tDH  
10  
tRWC  
tRWD  
READ-MODI<Y-WRITE Cycle Time  
108  
64  
133  
77  
RAS to WE Delay Time during  
READ-MODI<Y-WRITE Cycle(14)  
tCWD  
tAWD  
tPC  
CAS to WE Delay Time(14, 20)  
Column-Address to WE Delay Time(14)  
26  
39  
20  
—
—
—
32  
47  
25  
—
—
—
ns  
ns  
ns  
<ast Page Mode READ or WRITE  
Cycle Time(24)  
tRASP  
tCPA  
RAS Pulse Width  
50  
—
56  
5
100K  
30  
60  
—
68  
5
100K  
35  
ns  
ns  
ns  
ns  
Access Time from CAS Precharge(15)  
READ-WRITE Cycle Time(24)  
Data Output Hold after CAS LOW  
tPRWC  
tCOH  
tOꢀꢀ  
—
—
—
—
Output  
CAS or RAS(13,15,19, 29)  
Buffer  
Turn-Off  
Delay  
from  
1.6  
121  
tWHZ  
Output Disable Delay from WE  
3
10  
—
3
10  
—
ns  
ns  
tCLCH  
Last CAS going LOW to <irst CAS  
returning HIGH(23)  
10  
10  
tCSR  
tCHR  
tORD  
CAS Setup Time (CBR RE<RESH)(30, 20)  
CAS Hold Time (CBR RE<RESH)(30, 21)  
5
8
0
—
—
—
5
10  
0
—
—
—
ns  
ns  
ns  
OE Setup Time prior to RAS during  
HIDDEN RE<RESH Cycle  
tREꢀ  
tT  
Auto Refresh Period (1,024 Cycles)  
Transition Time (Rise or <all)(2, 3)  
—
1
16  
50  
—
1
16  
50  
ms  
ns  
AC TEST CONDITIONS  
Output load:  
Two TTL Loads and 50 p< (Vcc = 5.0V ±10%)  
One TTL Load and 50 p< (Vcc = 3.3V ±10%)  
Input timing reference levels: VIH = 2.4V, VIL = 0.8V (Vcc = 5.0V ±10%);  
VIH = 2.0V, VIL = 0.8V (Vcc = 3.3V ±10%)  
Output timing reference levels: VOH = 2.0V, VOL = 0.8V (Vcc = 5V ±10%, 3.3V ±10%)  
S2-8  
Integrated Circuit Solution Inc.  
DR014-0A 06/07/2001  

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