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IC41LV16105-50K PDF预览

IC41LV16105-50K

更新时间: 2024-02-01 20:17:53
品牌 Logo 应用领域
矽成 - ICSI 动态存储器光电二极管内存集成电路
页数 文件大小 规格书
18页 188K
描述
Fast Page DRAM, 1MX16, 50ns, CMOS, PDSO42,

IC41LV16105-50K 技术参数

是否Rohs认证: 不符合生命周期:Transferred
包装说明:SOJ, SOJ42,.44Reach Compliance Code:unknown
风险等级:5.83最长访问时间:50 ns
I/O 类型:COMMONJESD-30 代码:R-PDSO-J42
JESD-609代码:e0内存密度:16777216 bit
内存集成电路类型:FAST PAGE DRAM内存宽度:16
端子数量:42字数:1048576 words
字数代码:1000000最高工作温度:70 °C
最低工作温度:组织:1MX16
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:SOJ封装等效代码:SOJ42,.44
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
电源:3.3 V认证状态:Not Qualified
刷新周期:1024自我刷新:NO
最大待机电流:0.0005 A子类别:DRAMs
最大压摆率:0.16 mA标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:J BEND端子节距:1.27 mm
端子位置:DUALBase Number Matches:1

IC41LV16105-50K 数据手册

 浏览型号IC41LV16105-50K的Datasheet PDF文件第3页浏览型号IC41LV16105-50K的Datasheet PDF文件第4页浏览型号IC41LV16105-50K的Datasheet PDF文件第5页浏览型号IC41LV16105-50K的Datasheet PDF文件第7页浏览型号IC41LV16105-50K的Datasheet PDF文件第8页浏览型号IC41LV16105-50K的Datasheet PDF文件第9页 
IC41C16105  
IC41LV16105  
ELECTRICAL CHARACTERISTICS(1)  
(Recommended Operating Conditions unless otherwise noted.)  
Symbol Parameter  
Test Condition  
Speed Min.  
Max.  
Unit  
IIL  
Input Leakage Current  
Any input 0V ꢀ VIN ꢀ Vcc  
Other inputs not under test = 0V  
–5  
5
µA  
IIO  
Output Leakage Current  
Output High Voltage Level  
Output Low Voltage Level  
Standby Current: TTL  
Output is disabled (Hi-Z)  
0V ꢀ VOUT ꢀ Vcc  
–5  
2.4  
5
µA  
V
VOH  
VOL  
ICC1  
IOH = –5.0 mA (5V)  
IOH = –2.0 mA (3.3V)  
—
IOL = 4.2 mA (5V)  
IOL = 2.0 mA (3.3V)  
—
0.4  
V
RAS, LCAS, UCAS > VIH  
Commerical  
5V  
1
3
—
2mA  
3.3V  
Extended & Idustrial 5V  
3.3V  
—
—
—
mA  
2
ICC2  
ICC3  
Standby Current: CMOS  
RAS, LCAS, UCAS > VCC – 0.2V  
5V  
3.3V  
—
—
1
0.5  
mA  
mA  
Operating Current:  
Random Read/Write(2,3,4)  
Average Power Supply Current  
RAS, LCAS, UCAS,  
Address Cycling, tRC = tRC (min.)  
-50  
-60  
—
—
160  
145  
ICC4  
ICC5  
ICC6  
Operating Current:  
<ast Page Mode(2,3,4)  
Average Power Supply Current  
RAS = VIL, LCAS, UCAS,  
Cycling tPC = tPC (min.)  
-50  
-60  
—
—
90  
80  
mA  
mA  
mA  
Refresh Current:  
RAS-Only(2,3)  
Average Power Supply Current  
RAS Cycling, LCAS, UCAS > VIH  
tRC = tRC (min.)  
-50  
-60  
—
—
160  
145  
Refresh Current:  
CBR(2,3,5)  
Average Power Supply Current  
RAS, LCAS, UCAS Cycling  
tRC = tRC (min.)  
-50  
-60  
—
—
160  
145  
Notes:  
1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper device  
operation is assured. The eight RAS cycles wake-up should be repeated any time the tREꢀ refresh requirement is exceeded.  
2. Dependent on cycle rates.  
3. Specified values are obtained with minimum cycle time and the output open.  
4. Column-address is changed once each ꢀast page cycle.  
5. Enables on-chip refresh and address counters.  
S2-6  
Integrated Circuit Solution Inc.  
DR014-0A 06/07/2001  

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