-sram/62256alt1
http://www.hea.com/hean2/sram/62256alt1.htm
DATA RETENTION CHARACTERISTIC
TA= 0°C to 70°C (normal) /-40°C to 85°C (E.T.)
Symbol
Parameter
Test Condition Min Typ Max Unit
/CS >= Vcc-0.2V
Vss <= VIN <=
Vcc
VDR
Vcc for Data Re! ention
2
-
-
V
Vcc = 3.0V
/CS >= Vcc
-0.2V
Vss <= VIN
<= Vcc
L
-
1
1
1
50 uA
15(2) uA
50 uA
Data
Retention
Current
HY62256A
LL -
ICCDR
HY62256A-1
L
-
Chip Disable to Data Retention
Time
See Data
Retention Timing
Diagram
tCDR
0
-
-
-
ns
ns
tR
Operating Recovery Time
tRC(3) -
Notes
1. Typical values are under the condition of TA = 25°C
2. 3uA max. at TA= 0°C to 40°C
3. tRC is read cycle time.
Data Retention Timing Diagram
RELIABILITY SPEC.
TEST MODE
TEST SPEC.
>= 2000V
>= 250V
HBM
MM
ESD
<= -100mA
>= 100mA
LATCH-UP
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Copyright © 1997 Hyundai Electronics America.
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