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HS7541AJN

更新时间： 2024-02-05 21:17:03
品牌 Logo 应用领域
西伯斯 - SIPEX 转换器数模转换器光电二极管
页数 文件大小 规格书
7页 113K
描述
12-Bit CMOS Multiplying DAC

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中文翻译

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HS7541AJN 技术参数

是否Rohs认证： 不符合生命周期：Obsolete
包装说明：DIP, DIP18,.3Reach Compliance Code：unknown
风险等级：5.92转换器类型：D/A CONVERTER
输入位码：BINARY, OFFSET BINARYJESD-30 代码：R-XDIP-T18
JESD-609代码：e0最大线性误差 (EL)：0.01%
位数：12功能数量：1
端子数量：18最高工作温度：125 °C
最低工作温度：-55 °C封装主体材料：CERAMIC
封装代码：DIP封装等效代码：DIP18,.3
封装形状：RECTANGULAR封装形式：IN-LINE
电源：15 V认证状态：Not Qualified
子类别：Other Converters标称供电电压：15 V
表面贴装：NO技术：CMOS
温度等级：MILITARY端子面层：Tin/Lead (Sn/Pb)
端子形式：THROUGH-HOLE端子节距：2.54 mm
端子位置：DUALBase Number Matches：1

HS7541AJN 数据手册

 浏览型号HS7541AJN的Datasheet PDF文件第1页浏览型号HS7541AJN的Datasheet PDF文件第2页浏览型号HS7541AJN的Datasheet PDF文件第4页浏览型号HS7541AJN的Datasheet PDF文件第5页浏览型号HS7541AJN的Datasheet PDF文件第6页浏览型号HS7541AJN的Datasheet PDF文件第7页 
SPECIFICATIONS (continued)  
(TA=25°C; VDD =+15V, VREF = +10V; IO1 = IO2 = GND = 0V; unipolar unless otherwise noted.)  
PARAMETER  
MIN.  
TYP.  
MAX.  
UNIT  
CONDITIONS  
DIGITAL INPUTS  
Logic Levels  
VIH  
2.4  
VDD  
2.4  
0.8  
0.8  
±1.0  
±10  
Volts  
Volts  
Volts  
Volts  
µA  
Note 5  
VIL  
-0.3  
Note 5  
Input Current  
VIN = 0V or VDD  
Note 5 and 15  
VIN = 0; Note 5 and 14  
Note 5  
µA  
Input Capacitance  
Bits 1—12  
Coding  
8
pF  
Unipolar  
Binary  
Bipolar  
Offset Binary  
POWER REQUIREMENTS  
Voltage Range  
+5  
+15  
+16  
2.5  
Volts  
Volts  
mA  
Note 16  
Note 5  
Supply Current  
2.0  
0.2  
All digital inputs VIL or VIH  
Note 5; all digital inputs VIL or  
VIH  
All digital inputs 0V or 5V to  
VDD  
2.5  
mA  
0.5  
1.0  
mA  
mA  
Note 5; all digital inputs 0V or  
5V to VDD  
ENVIRONMENTAL AND MECHANICAL  
Operating Temperature  
-AK, -AJ  
-AB, -AA  
Storage Temperature  
Package  
0
-40  
-65  
+70  
+85  
+150  
°C  
°C  
°C  
-AK, -AJ  
18-pin plastic DIP, 20-pin PLCC, 18–pin SOIC  
Notes and Cautions:  
1.  
2.  
Do not apply voltages higher than VDD or less than GND potential on any terminal other than VREF or V  
.
The digital inputs are diode-clamp protected against ESD damage. However, permanent damage mayRoFcBcur  
on unprotected units from high-energy electrostatic fields. Keep units in conductive foam at all times until  
ready to use.  
3.  
4.  
Use proper anti-static handling procedures.  
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the  
device. This is a stress rating only and functional operation at or above these specifications is not implied.  
Exposure to the above maximum rated conditions for extended periods may affect device reliability.  
5.  
6.  
From T to TMAX.  
IntegralMNINon-linearity is measured as the arithmetic mean value of the magnitudes of the greatest positive  
deviation and the greatest negative deviation from the theoretical value of any given input combination.  
Differential Non-linearity is the deviation of an output step from the theoretical value of 1 LSB for any two  
adjacent digital input codes.  
7.  
8.  
9.  
AC performance characteristics are included for design guidance only and are subject to sample testing only.  
RL = 100Ω, CEXT = 13pF; all data inputs 0V to VDD or VDD to 0V; from 50% digital input change to 90% of final  
analog output.  
10.  
11.  
12.  
13.  
14.  
15.  
16.  
17.  
18.  
Settling to ±0.01% FSR (strobed); all data inputs 0V to VDD or VDD to 0V.  
VREF = 0V, DAC register alternatively loaded with all 0’s and all 1’s.  
VREF = 20VP-P; F = 10kHz sinewave.  
VREF = 20VP-P; F = 1kHz sinewave.  
Guaranteed by design, but not production tested.  
Logic inputs are MOS gates. I typically is less than 1nA @ 25°C.  
Accuracy is guaranteed at VDDIN= +15V only.  
Measured using internal feedback resistor with DAC loaded with all 1’s.  
All digital inputs = 0V.  
HS7541A  
12-Bit CMOS Multiplying DAC  
© Copyright 2000 Sipex Corporation  
3
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中文翻译

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