Reliability specification
◆
Standard
Test items
Condition (test methods (JIS C5201-1)
≦47Ω
≧47Ω
70℃, rated voltage, 1 90min on 30min off, 1000hours
±(0.5%+0.05Ω) ±(0.25%+0.01Ω)
±(0.25%+0.05Ω) ±(0.1%+0.01Ω)
±(0.25%+0.05Ω) ±(0.1%+0.01Ω)
±(0.25%+0.05Ω) ±(0.1%+0.01Ω)
±(0.25%+0.05Ω) ±(0.1%+0.01Ω)
*
Life (biased)
High temperature high humidity
Temperature shock
85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 1000hours
-55℃ (30min) ~ 125℃ (30min) 1000cycles
155℃, no bias, 1000hours
High temperature exposure
Resistance to soldering heat
260±5℃, 10 seconds (reflow)
*1 Rated voltage is given by E= R x P
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
Reliability test data
◆
Biased life test
High temperature high humidity (biased)
○
○
0.12
0.12
0.10
0.10
Load Life @ 70℃ at
Temperature Humidity Bias
0.08
0.08
Rated Power 1.0Wꢀn = 4
0.1W n = 25
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
HRG3216:10kΩ
HRG3216:10kΩ
-0.08
-0.10
-0.12
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000ꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000ꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
Temperature shock
High temperature exposure
○
○
0.12
0.12
0.10
0.10
Thermal Shock
High Temperature Exposure
0.08
0.08
-55℃ - +125℃ n = 25
at 155℃ with no power n = 25
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
HRG3216:10kΩ
HRG3216:10kΩ
-0.08
-0.08
-0.10
-0.10
-0.12
-0.12
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000ꢀꢀꢀꢀꢀꢀꢀ10000
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000ꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
Test duration(h)
Derating Curve
◆
100
50
0
-55ꢀꢀꢀꢀ 0ꢀꢀꢀꢀꢀ50ꢀ70ꢀꢀ100ꢀꢀꢀꢀꢀ155
Ambient temperature (℃)
30