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HCS241D/SAMPLE PDF预览

HCS241D/SAMPLE

更新时间: 2024-02-28 22:29:45
品牌 Logo 应用领域
瑞萨 - RENESAS 驱动输出元件逻辑集成电路
页数 文件大小 规格书
9页 171K
描述
HC/UH SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, CDIP20

HCS241D/SAMPLE 技术参数

生命周期:Obsolete零件包装代码:DIP
包装说明:DIP,针数:20
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.1系列:HC/UH
JESD-30 代码:R-CDIP-T20逻辑集成电路类型:BUS DRIVER
位数:4功能数量:2
端口数量:2端子数量:20
输出特性:3-STATE输出极性:TRUE
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:DIP
封装形状:RECTANGULAR封装形式:IN-LINE
传播延迟(tpd):21 ns认证状态:Not Qualified
座面最大高度:5.08 mm最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL宽度:7.62 mm
Base Number Matches:1

HCS241D/SAMPLE 数据手册

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HCS241MS  
Intersil Space Level Product Flow - ‘MS’  
Wafer Lot Acceptance (All Lots) Method 5007  
(Includes SEM)  
100% Interim Electrical Test 1 (T1)  
100% Delta Calculation (T0-T1)  
GAMMA Radiation Verification (Each Wafer) Method 1019,  
4 Samples/Wafer, 0 Rejects  
100% Static Burn-In 2, Condition A or B, 24 hrs. min.,  
+125oC min., Method 1015  
100% Nondestructive Bond Pull, Method 2023  
Sample - Wire Bond Pull Monitor, Method 2011  
Sample - Die Shear Monitor, Method 2019 or 2027  
100% Internal Visual Inspection, Method 2010, Condition A  
100% Interim Electrical Test 2 (T2)  
100% Delta Calculation (T0-T2)  
100% PDA 1, Method 5004 (Notes 1and 2)  
100% Dynamic Burn-In, Condition D, 240 hrs., +125oC or  
100% Temperature Cycle, Method 1010, Condition C,  
10 Cycles  
Equivalent, Method 1015  
100% Interim Electrical Test 3 (T3)  
100% Delta Calculation (T0-T3)  
100% Constant Acceleration, Method 2001, Condition per  
Method 5004  
100% PDA 2, Method 5004 (Note 2)  
100% Final Electrical Test  
100% PIND, Method 2020, Condition A  
100% External Visual  
100% Fine/Gross Leak, Method 1014  
100% Radiographic, Method 2012 (Note 3)  
100% External Visual, Method 2009  
Sample - Group A, Method 5005 (Note 4)  
100% Data Package Generation (Note 5)  
100% Serialization  
100% Initial Electrical Test (T0)  
100% Static Burn-In 1, Condition A or B, 24 hrs. min.,  
+125oC min., Method 1015  
NOTES:  
1. Failures from Interim electrical test 1 and 2 are combined for determining PDA 1.  
2. Failures from subgroup 1, 7, 9 and deltas are used for calculating PDA. The maximum allowable PDA = 5% with no more than 3% of the  
failures from subgroup 7.  
3. Radiographic (X-Ray) inspection may be performed at any point after serialization as allowed by Method 5004.  
4. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005.  
5. Data Package Contents:  
• Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quan-  
tity).  
• Wafer Lot Acceptance Report (Method 5007). Includes reproductions of SEM photos with percent of step coverage.  
• GAMMA Radiation Report. Contains Cover page, disposition, Rad Dose, Lot Number, Test Package used, Specification Numbers, Test  
equipment, etc. Radiation Read and Record data on file at Intersil.  
• X-Ray report and film. Includes penetrometer measurements.  
• Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).  
• Lot Serial Number Sheet (Good units serial number and lot number).  
• Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test.  
• The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed  
by an authorized Quality Representative.  
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate  
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com  
Sales Office Headquarters  
NORTH AMERICA  
EUROPE  
ASIA  
Intersil Corporation  
Intersil SA  
Mercure Center  
100, Rue de la Fusee  
1130 Brussels, Belgium  
TEL: (32) 2.724.2111  
FAX: (32) 2.724.22.05  
Intersil (Taiwan) Ltd.  
Taiwan Limited  
7F-6, No. 101 Fu Hsing North Road  
Taipei, Taiwan  
Republic of China  
TEL: (886) 2 2716 9310  
FAX: (886) 2 2715 3029  
P. O. Box 883, Mail Stop 53-204  
Melbourne, FL 32902  
TEL: (321) 724-7000  
FAX: (321) 724-7240  
Spec Number 518838  
308  

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