Datasheet > HCPL-5760-100

HCPL-5760-100

更新时间： 2024-11-01 12:06:59

品牌	Logo	应用领域
惠普 - HP		光电
页数	文件大小	规格书
11页	163K
描述
AC/DC to Logic Interface Hermetically Sealed Optocouplers

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中文翻译

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数据手册

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HCPL-5760-100 数据手册

AC/DC to Logic Interface

Hermetically Sealed

Optocouplers

Technical Data

HCPL-576X*

5962-8947701

*See matrix for available extensions

Features

Applications

• Military and Space

• High Reliability Systems

• Transportation, Medical,

and Life Critical Systems

• Limit Switch Sensing

• Low Voltage Detector

• ac/dc Voltage Sensing

• Relay Contact Monitor

• Relay Coil Voltage Monitor

• Current Sensing

• Microprocessor Interface

• Telephone Ring Detection

• Harsh Industrial

Environments

Description

• Dual Marked with Device

Part Number and DSCC

Standard Microcircuit

Drawing

• Manufactured and Tested

on a MIL-PRF-38534

Certified Line

• QML-38534, Class H and K

• Hermetically Sealed 8-pin

Dual In-Line Packages

• Performance Guaranteed

over -55°C to +125°C

• ac or dc Input

• Programmable Sense Voltage

• Hysteresis

These devices are single channel,

hermetically sealed, voltage/

current threshold detection

optocouplers. The products are

capable of operation and storage

over the full military temperature

range and can be purchased as

either standard product, or with

full MIL-PRF-38534 Class Level

H or K testing, or from the DSCC

Standard Microcircuit Drawing

(SMD) 5962-89477. All devices

are manufactured and tested on

a MIL-PRF-38534 certified line

and are included in the DSCC

Qualified Manufacturers List,

QML-38534 for Hybrid

• HCPL-3700 Operating

Compatibility

Schematic

Microcircuits.

• Logic Compatible Output

• 1500 Vdc Withstand Test

Voltage

• Thresholds Guaranteed over

Temperature

• Thresholds Independent of

LED Characteristics

HCPL-5760/1/K

The connection of a 0.1 µF bypass capacitor between pins 8 and 5 is recommended.

CAUTION: It is advised that normal static precautions be taken in handling and assembly of this component to

prevent damage and/or degradation which may be induced by ESD.

12 3 4 5 6 7...11

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