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GS881E18BD-250IT PDF预览

GS881E18BD-250IT

更新时间: 2024-11-12 09:43:51
品牌 Logo 应用领域
GSI 静态存储器内存集成电路
页数 文件大小 规格书
39页 1352K
描述
Cache SRAM, 512KX18, 5.5ns, CMOS, PBGA165, 13 X 15 MM, 1 MM PITCH, FPBGA-165

GS881E18BD-250IT 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:LBGA,
针数:165Reach Compliance Code:unknown
ECCN代码:3A991.B.2.BHTS代码:8542.32.00.41
风险等级:5.92最长访问时间:5.5 ns
其他特性:FLOW-THROUGH OR PIPELINED ARCHITECTURE; ALSO OPERATES AT 3.3V SUPPLYJESD-30 代码:R-PBGA-B165
JESD-609代码:e0长度:15 mm
内存密度:9437184 bit内存集成电路类型:CACHE SRAM
内存宽度:18湿度敏感等级:3
功能数量:1端子数量:165
字数:524288 words字数代码:512000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:512KX18
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
认证状态:Not Qualified座面最大高度:1.4 mm
最大供电电压 (Vsup):2.7 V最小供电电压 (Vsup):2.3 V
标称供电电压 (Vsup):2.5 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:TIN LEAD端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:13 mm

GS881E18BD-250IT 数据手册

 浏览型号GS881E18BD-250IT的Datasheet PDF文件第2页浏览型号GS881E18BD-250IT的Datasheet PDF文件第3页浏览型号GS881E18BD-250IT的Datasheet PDF文件第4页浏览型号GS881E18BD-250IT的Datasheet PDF文件第5页浏览型号GS881E18BD-250IT的Datasheet PDF文件第6页浏览型号GS881E18BD-250IT的Datasheet PDF文件第7页 
GS881E18B(T/D)/GS881E32B(T/D)/GS881E36B(T/D)  
250 MHz150 MHz  
100-Pin TQFP & 165-bump BGA  
Commercial Temp  
Industrial Temp  
512K x 18, 256K x 32, 256K x 36  
9Mb Sync Burst SRAMs  
2.5 V or 3.3 V V  
DD  
2.5 V or 3.3 V I/O  
Linear Burst Order (LBO) input. The Burst function need not  
be used. New addresses can be loaded on every cycle with no  
degradation of chip performance.  
Features  
• FT pin for user-configurable flow through or pipeline  
operation  
• Dual Cycle Deselect (DCD) operation  
• IEEE 1149.1 JTAG-compatible Boundary Scan  
• 2.5 V or 3.3 V +10%/–10% core power supply  
• 2.5 V or 3.3 V I/O supply  
• LBO pin for Linear or Interleaved Burst mode  
• Internal input resistors on mode pins allow floating mode pins  
• Default to Interleaved Pipeline mode  
• Byte Write (BW) and/or Global Write (GW) operation  
• Internal self-timed write cycle  
• Automatic power-down for portable applications  
• JEDEC-standard 100-lead TQFP and 165-bump BGA  
packages  
• RoHS-compliant 100-lead TQFP and 165-bump BGA  
packages available  
Flow Through/Pipeline Reads  
The function of the Data Output register can be controlled by  
the user via the FT mode pin (Pin 14). Holding the FT mode  
pin low places the RAM in Flow Through mode, causing  
output data to bypass the Data Output Register. Holding FT  
high places the RAM in Pipelie mode, activating the rising-  
edge-triggered Data Outegister.  
DCD Pipelined Reads  
The GS881E18B(T/D)/GS881E32B(T/D)/GS881E36B(T/D)  
is a DCD (Dual ycle Deselect) pipelined synchronous  
SRAM. SCD (Single Cycle Deselect) versions are also  
available. DCD SRAMs pipeline disable commands to the  
same degree as read commands. DCD RAMs hold the deselect  
comnd for one full cycle and then begin turning off their  
outputs just after the second rising edge of clock.  
Functional Description  
Byte Write and Global Write  
Applications  
Byte write operation is performed by using Byte Write enable  
(BW) input combined with one or more individual byte write  
signals (Bx). In addition, Global Write (GW) is available for  
writing all bytes at one time, regardless of the Byte Write  
control inputs.  
The GS881E18B(T/D)/GS881E32B(T/D)/GS881E36B(T/D)  
is a 9,437,184-bit high performance synchronous SRAM wh  
a 2-bit burst address counter. Although of a type originally  
developed for Level 2 Cache applications supportinhigh  
performance CPUs, the device now finds application in  
synchronous SRAM applications, ranging from DSP main  
store to networking chip set support.  
Sleep Mode  
Low power (Sleep mode) is attained through the assertion  
(High) of the ZZ signal, or by stopping the clock (CK).  
Memory data is retained during Sleep mode.  
Controls  
Addresses, data I/Os, chip enable (E1), address burst control  
inputs (ADSP, ADSC, ADV) anwrite control inputs (Bx,  
BW, GW) are synchronous nd are controlled by a positive-  
edge-triggered clock input (CK). Output enable (G) and power  
down control (ZZ) are asynchronous inputs. Burst cycles can  
be initiated with eitheADSP or ADSC inputs. In Burst mode,  
subsequent burst addresses are generated internally and are  
controlled by ADV. The burst address counter may be  
configured to count in either linear or interleave order with the  
Core and Interface Voltages  
The GS881E18B(T/D)/GS881E32B(T/D)/GS881E36B(T/D)  
operates on a 2.5 V or 3.3 V power supply. All input are 3.3 V  
and 2.5 V compatible. Separate output power (V  
) pins are  
DDQ  
used to decouple output noise from the internal circuits and are  
3.3 V and 2.5 V compatible.  
Paramter Synopsis  
-333  
-300  
-250  
-200  
-150  
Unit  
tKQ  
2.5  
3.0  
2.5  
3.3  
2.5  
4.0  
3.0  
5.0  
3.8  
6.7  
ns  
ns  
tCycle  
Pipeline  
3-1-1-1  
Curr (x18)  
Curr (x32/x36)  
250  
290  
230  
265  
200  
230  
170  
195  
140  
160  
mA  
mA  
tKQ  
4.5  
4.5  
5.0  
5.0  
5.5  
5.5  
6.5  
6.5  
7.5  
7.5  
ns  
ns  
tCycle  
Flow Through  
2-1-1-1  
Curr (x18)  
Curr (x32/x36)  
200  
230  
185  
210  
160  
185  
140  
160  
128  
145  
mA  
mA  
Rev: 1.04a 3/2009  
1/39  
© 2002, GSI Technology  
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.  

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