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FQPF24N08 PDF预览

FQPF24N08

更新时间: 2024-09-28 23:52:47
品牌 Logo 应用领域
其他 - ETC 晶体晶体管
页数 文件大小 规格书
8页 694K
描述
TRANSISTOR | MOSFET | N-CHANNEL | 80V V(BR)DSS | 17A I(D) | TO-220F

FQPF24N08 数据手册

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August 2000  
TM  
QFET  
FQPF24N08  
80V N-Channel MOSFET  
General Description  
Features  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary,  
planar stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the  
avalanche and commutation mode. These devices are well  
suited for low voltage applications such as automotive, high  
efficiency switching for DC/DC converters, and DC motor  
control.  
17A, 80V, RDS(on) = 0.06@VGS = 10 V  
Low gate charge ( typical 19 nC)  
Low Crss ( typical 50 pF)  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
175°C maximum junction temperature rating  
D
!
"
! "  
"
!
G
"
G D  
S
TO-220F  
FQPF Series  
!
S
Absolute Maximum Ratings  
T = 25°C unless otherwise noted  
C
Symbol  
VDSS  
Parameter  
FQPF24N08  
Units  
V
Drain-Source Voltage  
80  
17  
ID  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
- Pulsed  
Drain Current  
A
12  
A
IDM  
(Note 1)  
Drain Current  
68  
A
VGSS  
EAS  
IAR  
Gate-Source Voltage  
± 25  
230  
V
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
17  
EAR  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
Power Dissipation (TC = 25°C)  
3.8  
mJ  
V/ns  
W
dv/dt  
PD  
6.5  
38  
- Derate above 25°C  
Operating and Storage Temperature Range  
0.25  
-55 to +175  
W/°C  
°C  
TJ, TSTG  
TL  
Maximum lead temperature for soldering purposes,  
300  
°C  
1/8" from case for 5 seconds  
Thermal Characteristics  
Symbol  
Parameter  
Typ  
--  
Max  
3.95  
62.5  
Units  
°C/W  
°C/W  
RθJC  
RθJA  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
--  
©2000 Fairchild Semiconductor International  
Rev. A, August 2000  

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