August 2000
TM
QFET
FQPF24N08
80V N-Channel MOSFET
General Description
Features
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for low voltage applications such as automotive, high
efficiency switching for DC/DC converters, and DC motor
control.
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17A, 80V, RDS(on) = 0.06Ω @VGS = 10 V
Low gate charge ( typical 19 nC)
Low Crss ( typical 50 pF)
Fast switching
100% avalanche tested
Improved dv/dt capability
175°C maximum junction temperature rating
D
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G
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G D
S
TO-220F
FQPF Series
!
S
Absolute Maximum Ratings
T = 25°C unless otherwise noted
C
Symbol
VDSS
Parameter
FQPF24N08
Units
V
Drain-Source Voltage
80
17
ID
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
- Pulsed
Drain Current
A
12
A
IDM
(Note 1)
Drain Current
68
A
VGSS
EAS
IAR
Gate-Source Voltage
± 25
230
V
(Note 2)
(Note 1)
(Note 1)
(Note 3)
Single Pulsed Avalanche Energy
Avalanche Current
mJ
A
17
EAR
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (TC = 25°C)
3.8
mJ
V/ns
W
dv/dt
PD
6.5
38
- Derate above 25°C
Operating and Storage Temperature Range
0.25
-55 to +175
W/°C
°C
TJ, TSTG
TL
Maximum lead temperature for soldering purposes,
300
°C
1/8" from case for 5 seconds
Thermal Characteristics
Symbol
Parameter
Typ
--
Max
3.95
62.5
Units
°C/W
°C/W
RθJC
RθJA
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient
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©2000 Fairchild Semiconductor International
Rev. A, August 2000