DATA SHEET
www.onsemi.com
Silicon Carbide (SiC)
Schottky Diode – EliteSiC,
8ꢀA, 650 V, D2, Power88
V
I
F
RRM
650 V
8.0 A
FFSM0865B
Silicon Carbide (SiC) Schottky Diodes use a completely new
technology that provides superior switching performance and higher
reliability compared to Silicon. No reverse recovery current,
temperature independent switching characteristics, and excellent
thermal performance sets Silicon Carbide as the next generation of
power semiconductor. System benefits include highest efficiency,
faster operating frequency, increased power density, reduced EMI, and
reduced system size and cost.
5 Cathode
3, 4 Anode
1, 2 Floating
Schottky Diode
Pin1
5
4
3
Features
2
1
• Max Junction Temperature 175°C
• Avalanche Rated 33 mJ
• High Surge Current Capacity
• Positive Temperature Coefficient
• Ease of Paralleling
• No Reverse Recovery / No Forward Recovery
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
PQFN4 8y 8, 2P
(Power88)
CASE 483AP
MARKING DIAGRAM
FFSM
0865B
AWLYWW
Applications
• General Purpose
• SMPS, Solar Inverter, UPS
• Power Switching Circuits
FFSM0865B
A
WL
Y
WW
= Specific Device Code
= Assembly Site
= Wafer Lot Number
= Year
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
C
Parameter
Symbol
Value
650
33
Unit
V
= Work Week
Peak Repetitive Reverse Voltage
Single Pulse Avalanche Energy (starting T
V
RRM
=
E
AS
mJ
C
25°C, I
= 11.5 A, L = 0.5 mH, V = 50 V)
L(pk)
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
Continuous Rectified Forward
Current
T
T
< 153
< 135
I
8.0
11.6
490
434
42
A
A
C
C
F
Non−Repetitive Peak Forward
T
C
= 25°C
I
FM
Surge Current (t = 10 ms)
P
T
C
= 150°C
= 25°C
Non−Repetitive Forward Surge
Current (Half−Sine Pulse)
T
C
I
A
FSM
t
= 8.3 ms
P
Power Dissipation
T
= 25°C
P
tot
91
15
W
C
T
C
= 150°C
Operating Junction and Storage Temperature
Range
T , T
−55 to
+175
°C
J
stg
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
THERMAL RESISTANCE
Parameter
Symbol
Value
Unit
Thermal Resistance, Junction−to−Case
R
1.64
°C/W
q
JC
© Semiconductor Components Industries, LLC, 2020
1
Publication Order Number:
January, 2023 − Rev. 2
FFSM0865B/D