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EN29LV320BT-70TIP PDF预览

EN29LV320BT-70TIP

更新时间: 2024-10-02 12:20:55
品牌 Logo 应用领域
EON 闪存存储内存集成电路光电二极管
页数 文件大小 规格书
49页 405K
描述
32 Megabit (4096K x 8-bit / 2048K x 16-bit) Flash Memory Boot Sector Flash Memory, CMOS 3.0 Volt-only

EN29LV320BT-70TIP 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Transferred零件包装代码:TSOP1
包装说明:TSOP1, TSSOP48,.8,20针数:48
Reach Compliance Code:unknownECCN代码:3A991.B.1.A
HTS代码:8542.32.00.51风险等级:5.56
最长访问时间:70 ns其他特性:TOP BOOT SECTOR
备用内存宽度:8启动块:TOP
命令用户界面:YES通用闪存接口:YES
数据轮询:YESJESD-30 代码:R-PDSO-G48
长度:18.4 mm内存密度:33554432 bit
内存集成电路类型:FLASH内存宽度:16
功能数量:1部门数/规模:8,63
端子数量:48字数:2097152 words
字数代码:2000000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:2MX16封装主体材料:PLASTIC/EPOXY
封装代码:TSOP1封装等效代码:TSSOP48,.8,20
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
电源:3/3.3 V编程电压:2.7 V
认证状态:Not Qualified就绪/忙碌:YES
座面最大高度:1.2 mm部门规模:8K,64K
最大待机电流:0.000005 A子类别:Flash Memories
最大压摆率:0.03 mA最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):2.7 V标称供电电压 (Vsup):3 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED切换位:YES
类型:NOR TYPE宽度:12 mm
Base Number Matches:1

EN29LV320BT-70TIP 数据手册

 浏览型号EN29LV320BT-70TIP的Datasheet PDF文件第2页浏览型号EN29LV320BT-70TIP的Datasheet PDF文件第3页浏览型号EN29LV320BT-70TIP的Datasheet PDF文件第4页浏览型号EN29LV320BT-70TIP的Datasheet PDF文件第5页浏览型号EN29LV320BT-70TIP的Datasheet PDF文件第6页浏览型号EN29LV320BT-70TIP的Datasheet PDF文件第7页 
EN29LV320B  
EN29LV320B  
32 Megabit (4096K x 8-bit / 2048K x 16-bit) Flash Memory  
Boot Sector Flash Memory, CMOS 3.0 Volt-only  
FEATURES  
JEDEC Standard compatible  
Single power supply operation  
- Full voltage range: 2.7 to 3.6 volts read and  
write operations  
Standard DATA# polling and toggle bits  
feature  
High performance  
- Access times as fast as 70 ns  
Erase Suspend / Resume modes:  
Read and program another Sector during  
Erase Suspend Mode  
Low power consumption (typical values at 5  
MHz)  
Support JEDEC Common Flash Interface  
- 9 mA typical active read current  
- 20 mA typical program/erase current  
- Less than 1 μA current in standby or automatic  
sleep mode  
(CFI).  
Low Vcc write inhibit < 2.5V  
Minimum 100K program/erase endurance  
cycles  
Flexible Sector Architecture:  
- Eight 8-Kbyte sectors, sixty-three 64k-byte  
sectors  
- 8-Kbyte sectors for Top or Bottom boot  
- Sector Group protection:  
Hardware locking of sectors to prevent  
program or erase operations within individual  
sectors  
Additionally, temporary Sector Unprotect  
allows code changes in previously locked  
sectors  
RESET# hardware reset pin  
- Hardware method to reset the device to read  
mode  
WP#/ACC input pin  
- Write Protect (WP#) function allows  
protection of outermost two boot sectors,  
regardless of sector protect status  
- Acceleration (ACC) function provides  
accelerated program times  
Package Options  
- 48-pin TSOP (Type 1)  
- 48 ball 6mm x 8mm TFBGA  
High performance program/erase speed  
- Word program time: 8µs typical  
- Sector erase time: 100ms typical  
- Chip erase time: 8s typical  
Industrial Temperature Range  
GENERAL DESCRIPTION  
The EN29LV320B is a 32-Megabit, electrically erasable, read/write non-volatile flash memory,  
organized as 4,194,304 bytes or 2.097,152 words. Any word can be programmed typically in 8µs.  
The EN29LV320B features 3.0V voltage read and write operation, with access times as fast as 70ns  
to eliminate the need for WAIT states in high-performance microprocessor systems.  
The EN29LV320B has separate Output Enable (OE#), Chip Enable (CE#), and Write Enable (WE#)  
controls, which eliminate bus contention issues. This device is designed to allow either single Sector  
or full Chip erase operation, where each Sector can be individually protected against program/erase  
operations or temporarily unprotected to erase or program. The device can sustain a minimum of  
100K program/erase cycles on each Sector.  
.
This Data Sheet may be revised by subsequent versions  
1
© 2004 Eon Silicon Solution, Inc.,  
www.eonssi.com  
or modifications due to changes in technical specifications.  
Rev. D, Issue Date: 2011/08/18  

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