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EDK1216CFBJ-75-F PDF预览

EDK1216CFBJ-75-F

更新时间: 2024-11-05 06:55:55
品牌 Logo 应用领域
尔必达 - ELPIDA 存储内存集成电路动态存储器双倍数据速率
页数 文件大小 规格书
56页 708K
描述
128M bits DDR Mobile RAM™

EDK1216CFBJ-75-F 技术参数

生命周期:Obsolete零件包装代码:BGA
包装说明:VFBGA,针数:60
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.02风险等级:5.84
Is Samacsys:N访问模式:FOUR BANK PAGE BURST
最长访问时间:6 ns其他特性:AUTO/SELF REFRESH
JESD-30 代码:R-PBGA-B60JESD-609代码:e1
长度:6 mm内存密度:134217728 bit
内存集成电路类型:DDR DRAM内存宽度:16
功能数量:1端口数量:1
端子数量:60字数:8388608 words
字数代码:8000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-25 °C
组织:8MX16封装主体材料:PLASTIC/EPOXY
封装代码:VFBGA封装形状:RECTANGULAR
封装形式:GRID ARRAY, VERY THIN PROFILE, FINE PITCH认证状态:Not Qualified
座面最大高度:1 mm自我刷新:YES
最大供电电压 (Vsup):1.95 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:OTHER
端子面层:TIN SILVER COPPER端子形式:BALL
端子节距:0.5 mm端子位置:BOTTOM
宽度:5.5 mmBase Number Matches:1

EDK1216CFBJ-75-F 数据手册

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PRELIMINARY DATA SHEET  
128M bits DDR Mobile RAM  
EDK1216CFBJ (8M words × 16 bits)  
Specifications  
Pin Configurations  
Density: 128M bits  
Organization  
/xxx indicates active low signal.  
60-ball FBGA  
2M words × 16 bits × 4 banks  
1
2
3
4
5
6
7
8
9
10  
Package: 60-ball FBGA  
Lead-free (RoHS compliant) and Halogen-free  
Power supply: VDD, VDDQ = 1.7V to 1.95V  
Clock frequency: 133MHz (max.)  
1KB page size  
A
B
C
D
E
VSS DQ15 VSSQ  
VDDQ DQ13 DQ14  
VSSQ DQ11 DQ12  
VDDQ DQ9 DQ10  
VSSQ UDQS DQ8  
VDDQ DQ0  
VDD  
DQ1  
DQ3  
DQ5  
DQ2 VSSQ  
DQ4 VDDQ  
DQ6 VSSQ  
Row address: A0 to A11  
Column address: A0 to A8  
Four internal banks for concurrent operation  
Interface: LVCMOS  
DQ7 LDQS VDDQ  
Burst lengths (BL): 2, 4, 8, 16  
Burst type (BT):  
Sequential (2, 4, 8, 16)  
Interleave (2, 4, 8, 16)  
/CAS Latency (CL): 3  
F
G
H
UDM  
CK  
VSS  
CKE  
A9  
NC  
/CK  
NC  
A8  
VDD  
NC  
/WE  
/CS  
LDM  
/CAS /RAS  
BA1  
A1  
A11  
A7  
BA0  
A0  
J
Precharge: auto precharge option for each burst  
A6  
A10  
A2  
access  
K
VSS  
A4  
A5  
A3  
VDD  
Driver strength: normal, 1/2, 1/4, 1/8  
Refresh: auto-refresh, self-refresh  
Refresh cycles: 4096 cycles/64ms  
Average refresh period: 15.6µs  
Operating ambient temperature range  
TA =25°C to +85°C  
(Top View)  
Address input  
A0 to A11  
BA0, BA1  
DQ0 to DQ15  
UDQS, LDQS  
/CS  
Bank select address  
Data-input/output  
Input and output data strobe  
Chip select  
/RAS  
/CAS  
/WE  
UDM, LDM  
CK  
/CK  
CKE  
VDD  
Row address strobe  
Column address strobe  
Write enable  
Write data mask  
Clock input  
Features  
Low power consumption  
Partial Array Self-Refresh (PASR)  
Differential clock input  
Clock enable  
Auto Temperature Compensated Self-Refresh  
(ATCSR) by built-in temperature sensor  
Power for internal circuit  
Ground for internal circuit  
Power for DQ circuit  
Ground for DQ circuit  
No connection  
VSS  
Double-data-rate architecture; two data transfers per  
VDDQ  
VSSQ  
NC  
one clock cycle  
Bi-directional data strobe (DQS) is transmitted  
/received with data for capturing data at the receiver.  
DQS is edge-aligned with data for READs; center-  
aligned with data for WRITEs  
Differential clock inputs (CK and /CK)  
Commands entered on each positive CK edge: data  
and data mask referenced to both edges of DQS  
Burst termination by burst stop command and  
Precharge command  
Document No. E1194E20 (Ver. 2.0)  
Date Published October 2009 (K) Japan  
Printed in Japan  
URL: http://www.elpida.com  
Elpida Memory, Inc. 2007-2009  

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