EB51F4D15CN-15.728M-CE
EB51F4 D 15 C N -15.728M - CE
Series
Cut Leads
5.0Vdc 14-Pin DIP HCMOS TCXO
Cut Leads to 4.445 ±0.500 (0.175" ±0.020")
Initial Tolerance
±2.5ppm Maximum
Value Added Option Prefix
Nominal Frequency
15.728MHz
Frequency Stability
±1.5ppm Maximum
Control Voltage
None (No Connect on Pin 1)
Operating Temperature Range
-20°C to +70°C
ELECTRICAL SPECIFICATIONS
Nominal Frequency
15.728MHz
Initial Tolerance
±2.5ppm Maximum (Measured at Nominal Vdd and Vc)
±1.5ppm Maximum
Frequency Stability
Frequency Stability vs. Input Voltage ±0.3ppm Maximum (Vdd ±5%)
Frequency Stability vs. Aging
Frequency Stability vs. Load
Operating Temperature Range
Supply Voltage
±1ppm/Year Maximum (at 25°C)
±0.2ppm Maximum (±10%)
-20°C to +70°C
5.0Vdc ±5%
Input Current
30mA Maximum (Measured at Steady State at 25°C; at Nominal Vdd and Nominal Vc)
Output Voltage Logic High (Voh)
Output Voltage Logic Low (Vol)
Rise/Fall Time
Vdd-0.5Vdc Minimum
0.5Vdc Maximum
6nSec Maximum (Measured at 20% to 80% of waveform)
50% ±5% (Measured at 50% of waveform)
30pF HCMOS Load Maximum
CMOS
Duty Cycle
Load Drive Capability
Output Logic Type
Control Voltage
None (No Connect on Pin 1)
10kOhms Typical
Input Impedance
Phase Noise
-70dBc/Hz at 10Hz Offset, -100dBc/Hz at 100Hz Offset, -130dBc/Hz at 1kHz Offset, -140dBc/Hz at 10kHz
Offset, -145dBc/Hz at 100kHz Offset (Typical Values at 19.440MHz)
Storage Temperature Range
-55°C to +125°C
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
Fine Leak Test
MIL-STD-883, Method 1014 Condition A
MIL-STD-883, Method 1014 Condition C
MIL-STD-883, Method 2004
Gross Leak Test
Lead Integrity
Mechanical Shock
Resistance to Soldering Heat
Resistance to Solvents
Solderability
MIL-STD-202, Method 213 Condition C
MIL-STD-202, Method 210
MIL-STD-202, Method 215
MIL-STD-883, Method 2003
Temperature Cycling
Vibration
MIL-STD-883, Method 1010
MIL-STD-883, Method 2007 Condition A
www.ecliptek.com | Specification Subject to Change Without Notice | Rev B 2/16/2010 | Page 1 of 4