DSEI 36 VRRM = 600 V
IFAVM = 37 A
Fast Recovery
Epitaxial Diode (FRED)
trr
= 35 ns
TO-263 AA
C
A
VRSM
V
VRRM
V
Type
NC
A
600
600
DSEI 36-06AS
C (TAB)
A =Anode, C = Cathode,
NC = No connection, TAB = Cathode
Symbol
IFRMS
Test Conditions
Maximum Ratings
Features
International standard surface mount
①
TVJ = TVJM
70
37
375
A
A
A
package JEDEC TO-263 AA
IFAVM
IFRM
①
TC = 85°C; rectangular, d = 0.5
tP < 10 ms; rep. rating, pulse width limited by TVJM
①
①
①
①
①
Planar passivated chips
Very short recovery time
Extremely low switching losses
Low I -values
IFSM
TVJ = 45°C; t = 10 ms (50 Hz), sine
300
320
A
A
t = 8.3 ms (60 Hz), sine
Soft rReMcovery behaviour
Epoxy meets UL 94V-0
TVJ = 150°C; t = 10 ms (50 Hz), sine
260
280
A
A
①
t = 8.3 ms (60 Hz), sine
I2t
TVJ = 45°C
t = 10 ms (50 Hz), sine
t = 8.3 ms (60 Hz), sine
450
420
A2s
A2s
TVJ = 150°C; t = 10 ms (50 Hz), sine
340
320
A2s
A2s
TO-263 AA Outline
t = 8.3 ms (60 Hz), sine
TVJ
TVJM
Tstg
-40...+150
150
-40...+150
°C
°C
°C
Ptot
TC = 25°C
125
2
W
g
Weight
Symbol
IR
Test Conditions
Characteristic Values
max.
typ.
TVJ = 25°C
TVJ = 25°C
VR = VRRM
VR = 0.8 • VRRM
100
50
7
mA
mA
mA
TVJ = 125°C VR = 0.8 • VRRM
VF
IF = 37 A;
TVJ = 150°C
TVJ = 25°C
1.4
1.6
V
V
Dim.
Millimeter
Inches
Min. Max.
Min.
Max.
A
A1
4.06
2.03
4.83
2.79
.160
.080
.190
.110
VT0
rT
For power-loss calculations only
TVJ = TVJM
1.01
7.1
V
mW
b
b2
0.51
1.14
0.99
1.40
.020
.045
.039
.055
RthJC
trr
1.0
50
11
K/W
ns
c
c2
0.46
1.14
0.74
1.40
.018
.045
.029
.055
IF = 1 A; -di/dt = 100 A/ms; VR = 30 V; TVJ = 25°C
35
10
D
D1
8.64
7.11
9.65
8.13
.340
.280
.380
.320
IRM
VR = 350 V; IF = 30 A; -diF/dt = 240 A/ms
L £ 0.05 mH; TVJ = 100°C
A
E
E1
e
9.65
6.86
2.54
10.29
8.13
BSC
.380
.270
.100 BSC
.405
.320
L
14.61
2.29
1.02
1.27
0
15.88
2.79
1.40
1.78
0.38
.575
.090
.040
.050
0
.625
.110
.055
.070
.015
Characteristic curves are located in the data sheet DSEI 30-06A.
L1
L2
L3
L4
R
0.46
0.74
.018
.029
① IFAVM rating includes reverse blocking losses at TVJM, VR = 0.8 VRRM, duty cycle d = 0.5
Data according to IEC 60747
IXYS reserves the right to change limits, test conditions and dimensions
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