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DS1075Z-100+ PDF预览

DS1075Z-100+

更新时间: 2024-02-09 15:24:51
品牌 Logo 应用领域
美信 - MAXIM 时钟光电二极管外围集成电路晶体
页数 文件大小 规格书
18页 247K
描述
Clock Generator, 100MHz, CMOS, PDSO8, 0.150 INCH, SOIC-8

DS1075Z-100+ 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:SOIC包装说明:SOP,
针数:8Reach Compliance Code:compliant
ECCN代码:EAR99HTS代码:8542.39.00.01
风险等级:5.73JESD-30 代码:R-PDSO-G8
JESD-609代码:e3长度:4.9 mm
湿度敏感等级:1端子数量:8
最高工作温度:70 °C最低工作温度:
最大输出时钟频率:100 MHz封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装形状:RECTANGULAR
封装形式:SMALL OUTLINE峰值回流温度(摄氏度):260
主时钟/晶体标称频率:50 MHz认证状态:Not Qualified
座面最大高度:1.75 mm最大供电电压:5.25 V
最小供电电压:4.75 V标称供电电压:5 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin (Sn)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:3.9 mmuPs/uCs/外围集成电路类型:CLOCK GENERATOR, OTHER
Base Number Matches:1

DS1075Z-100+ 数据手册

 浏览型号DS1075Z-100+的Datasheet PDF文件第5页浏览型号DS1075Z-100+的Datasheet PDF文件第6页浏览型号DS1075Z-100+的Datasheet PDF文件第7页浏览型号DS1075Z-100+的Datasheet PDF文件第9页浏览型号DS1075Z-100+的Datasheet PDF文件第10页浏览型号DS1075Z-100+的Datasheet PDF文件第11页 
DS1075  
Figure 7  
Depending on the relative timing of the SELX signal and the internal clock, there may be up to one full  
cycle of tI on the output after the falling edge of SELX . Then, the “low” time (tLOW) between output  
pulses will be dependent on the relative timing between tI and tE. The time interval between the falling  
edge of SELX and the first rising edge of the externally derived clock is tSIE. Approximate maximum and  
minimum values of these parameters are:  
tLOW (min) = tI/2  
t
LOW (max) = tI/2 + tE  
tSIE (min) = tI/2  
SIE (max) = 3 tI/2 + tE  
t
NOTE:  
In each case there will be a small additional delay due to internal propagation delays.  
FROM EXTERNAL TO INTERNAL CLOCK  
This is accomplished by a low to high transition on the SELX pin. In this case the switch is level  
triggered, to allow for the possibility of a clock signal not being present at OSCIN. Note therefore, that if  
a constant high-level signal is applied to OSCIN it will not be possible to switch over to the internal  
reference. (Level triggering was not employed for the switch from internal to external reference as this  
approach is slower and the internal clock may be running at a much higher frequency than the maximum  
allowed external clock rate). When SELX is high and a low level is sensed on EXTCLK, OUT0 will be  
held low until a falling edge occurs on INTCLK, then the next rising edge of INTCLK will be routed  
through to OUT0.  
Figure 8  
Depending on the relative timing of the SELX signal and the external clock, there may be up to one full tE  
high period on the output after the rising edge of SELX . Then, the “low” time (tLOW) between output  
pulses will be dependent on the relative timing between tI and tE. The time interval between the falling  
8 of 18  

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