CYK128K16MCCB
Output Current into Outputs (LOW)............................. 20 mA
Maximum Ratings
Static Discharge Voltage.......................................... > 2001V
(per MIL-STD-883, Method 3015)
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Latch-up Current.....................................................> 200 mA
Storage Temperature ................................–65°C to + 150°C
Operating Range
Ambient Temperature with
Power Applied............................................–55°C to + 125°C
Ambient
Temperature
Supply Voltage to Ground Potential................. –0.4V to 4.6V
Device
Range
VCC
DC Voltage Applied to Outputs
CYK128K16MCCB Industrial –25°C to +85°C 2.70V to
3.30V
in High-Z State[6, 7, 8]........................................ –0.4V to 3.7V
DC Input Voltage[6, 7, 8] .................................... –0.4V to 3.7V
Electrical Characteristics (Over the Operating Range)
CYK128K16MCCB-55 CYK128K16MCCB-70
Min. Typ.[5] Max. Min. Typ.[5] Max. Unit
Parameter
VCC
Description
Test Conditions
Supply Voltage
2.7
3.0
3.3
2.7
3.0
3.3
V
V
VOH
Output HIGH Voltage IOH = –0.1 mA
VCC = 2.70V VCC
0.4
–
VCC
0.4
–
VOL
VIH
Output LOW Voltage IOL = 0.1 mA
VCC = 2.70V
0.4
0.4
V
V
Input HIGH Voltage
Input LOW Voltage
VCC= 2.7V to 3.3V
0.8 *
VCC
VCC 0.8 *
+ 0.4V VCC
VCC
+ 0.4V
VIL
IIX
–0.4
–1
0.4
+1
+1
–0.4
–1
0.4
+1
+1
V
Input Leakage Current GND < VIN < VCC
µA
µA
IOZ
Output Leakage
Current
GND < VOUT < VCC, Output Disabled
–1
–1
ICC
VCC Operating Supply f = fMAX = 1/tRC
VCC = VCCmax
IOUT = 0 mA
CMOS levels
14
1
22
5
8
1
15
5
mA
mA
Current
f = 1 MHz
ISB1
Automatic CE
Power-Down Current VIN > VCC – 0.2V, VIN
—CMOS Inputs
CE > VCC − 0.2V
0.2V) f = fMAX (Address
and Data Only), f = 0
(OE, WE, BHEandBLE),
VCC = 3.3V
40
250
40
40
250
40
µA
µA
<
VCC = 3.30V
ISB2
Automatic CE
Power-Down Current VIN > VCC – 0.2V or VIN
CE > VCC – 0.2V
VCC = 3.3V
9
9
<
—CMOS Inputs 0.2V, f = 0, VCC = 3.30V
Capacitance[9]
Parameter
Description
Input Capacitance
Output Capacitance
Test Conditions
Max.
Unit
pF
CIN
TA = 25°C, f = 1 MHz,
VCC = VCC(typ)
8
8
COUT
pF
Thermal Resistance[9]
Parameter
Description
Test Conditions
BGA
Unit
ΘJA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per EIA
/ JESD51.
55
°C/W
ΘJC
Thermal Resistance
(Junction to Case)
17
°C/W
Notes:
6. V
7. V
= –0.5V for pulse durations less than 20 ns.
IL(MIN)
= V + 0.5V for pulse durations less than 20 ns.
IH(Max)
CC
8. Overshoot and undershoot specifications are characterized and are not 100% tested.
9. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05584 Rev. *C
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