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CY7C2670KV18-550BZI PDF预览

CY7C2670KV18-550BZI

更新时间: 2024-11-08 14:53:51
品牌 Logo 应用领域
英飞凌 - INFINEON 双倍数据速率
页数 文件大小 规格书
29页 741K
描述
DDR-II+ CIO

CY7C2670KV18-550BZI 数据手册

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CY7C2670KV18  
144-Mbit DDR II+ SRAM Two-Word Burst  
Architecture (2.5 Cycle Read Latency) with ODT  
144-Mbit DDR II+ SRAM Two-Word Burst Architecture (2.5 Cycle Read Latency) with ODT  
Features  
Configurations  
144-Mbit density (4 M × 36)  
With Read Cycle Latency of 2.5 cycles:  
CY7C2670KV18 – 4 M × 36  
550-MHz clock for high bandwidth  
Two-word burst for reducing address bus frequency  
Functional Description  
Double data rate (DDR) interfaces (data transferred at  
1100 MHz) at 550 MHz  
The CY7C2670KV18 is 1.8-V synchronous pipelined SRAM  
equipped with DDR II+ architecture. The DDR II+ consists of an  
SRAM core with advanced synchronous peripheral circuitry.  
Addresses for read and write are latched on alternate rising  
edges of the input (K) clock. Write data is registered on the rising  
edges of both K and K. Read data is driven on the rising edges  
of K and K. Each address location is associated with two 36-bit  
words (CY7C2670KV18) that burst sequentially into or out of the  
device.  
Available in 2.5 clock cycle latency  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Echo clocks (CQ and CQ) simplify data capture in high-speed  
systems  
Data valid pin (QVLD) to indicate valid data on the output  
These devices have an ODT feature supported for D[x:0]  
,
BWS[x:0], and K/K inputs, which helps eliminate external  
termination resistors, reduce cost, reduce board area, and  
simplify board routing.  
On-die termination (ODT) feature  
Supported for D[x:0], BWS[x:0], and K/K inputs  
Synchronous internally self-timed writes  
Asynchronous inputs include an output impedance matching  
input (ZQ). Synchronous data outputs (Q, sharing the same  
physical pins as the data inputs D) are tightly matched to the two  
output echo clocks CQ/CQ, eliminating the need for separately  
capturing data from each individual DDR SRAM in the system  
design.  
DDR II+ operates with 2.5-cycle read latency when DOFF is  
asserted high  
Operatessimilarto DDR Idevice with 1 cycle read latencywhen  
DOFF is asserted low  
[1]  
Core VDD = 1.8 V ± 0.1 V; I/O VDDQ = 1.4 V to VDD  
Supports both 1.5 V and 1.8 V I/O supply  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the K or K input clocks. Writes are  
conducted with on-chip synchronous self-timed write circuitry.  
High-speed transceiver logic (HSTL) inputs and variable drive  
HSTL output buffers  
For a complete list of related documentation, click here.  
Available in 165-ball fine-pitch ball grid array (FBGA) package  
(15 × 17 × 1.4 mm)  
Offered in non Pb-free package.  
JTAG 1149.1 compatible test access port  
Phase locked loop (PLL) for accurate data placement  
Selection Guide  
Description  
Maximum operating frequency  
550 MHz  
550  
450 MHz Unit  
450  
980  
MHz  
mA  
Maximum operating current  
× 36  
1140  
Note  
1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support V  
= 1.4 V to V  
.
DD  
DDQ  
Cypress Semiconductor Corporation  
Document Number: 001-44143 Rev. *M  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised January 4, 2018  

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