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CY7C1513V18-200BZC PDF预览

CY7C1513V18-200BZC

更新时间: 2024-11-01 05:19:47
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
23页 371K
描述
72-Mbit QDR⑩-II SRAM 4-Word Burst Architecture

CY7C1513V18-200BZC 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:15 X 17 MM, 1.40 MM HEIGHT, MO-216, FBGA-165
针数:165Reach Compliance Code:not_compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.86最长访问时间:0.45 ns
其他特性:PIPELINED ARCHITECTURE最大时钟频率 (fCLK):200 MHz
I/O 类型:SEPARATEJESD-30 代码:R-PBGA-B165
JESD-609代码:e0长度:17 mm
内存密度:75497472 bit内存集成电路类型:QDR SRAM
内存宽度:18湿度敏感等级:3
功能数量:1端子数量:165
字数:4194304 words字数代码:4000000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:4MX18
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:LBGA封装等效代码:BGA165,11X15,40
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):220
电源:1.5/1.8,1.8 V认证状态:Not Qualified
座面最大高度:1.4 mm最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.75 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:15 mm
Base Number Matches:1

CY7C1513V18-200BZC 数据手册

 浏览型号CY7C1513V18-200BZC的Datasheet PDF文件第2页浏览型号CY7C1513V18-200BZC的Datasheet PDF文件第3页浏览型号CY7C1513V18-200BZC的Datasheet PDF文件第4页浏览型号CY7C1513V18-200BZC的Datasheet PDF文件第5页浏览型号CY7C1513V18-200BZC的Datasheet PDF文件第6页浏览型号CY7C1513V18-200BZC的Datasheet PDF文件第7页 
CY7C1511V18  
CY7C1526V18  
CY7C1513V18  
CY7C1515V18  
PRELIMINARY  
72-Mbit QDR™-II SRAM 4-Word Burst  
Architecture  
Features  
Functional Description  
• Separate Independent Read and Write Data Ports  
— Supports concurrent transactions  
The CY7C1511V18, CY7C1526V18, CY7C1513V18, and  
CY7C1515V18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with QDR-II architecture. QDR-II architecture  
consists of two separate ports to access the memory array.  
The Read port has dedicated Data Outputs to support Read  
operations and the Write Port has dedicated Data Inputs to  
support Write operations. QDR-II architecture has separate  
data inputs and data outputs to completely eliminate the need  
to “turn-around” the data bus required with common I/O  
devices. Access to each port is accomplished through a  
common address bus. Addresses for Read and Write  
addresses are latched on alternate rising edges of the input  
(K) clock. Accesses to the QDR-II Read and Write ports are  
completely independent of one another. In order to maximize  
data throughput, both Read and Write ports are equipped with  
Double Data Rate (DDR) interfaces. Each address location is  
associated with four 8-bit words (CY7C1511V18) or 9-bit  
words (CY7C1526V18) or 18-bit words (CY7C1513V18) or  
36-bit words (CY7C1515V18) that burst sequentially into or  
out of the device. Since data can be transferred into and out  
of the device on every rising edge of both input clocks (K and  
K and C and C), memory bandwidth is maximized while simpli-  
fying system design by eliminating bus “turn-arounds”.  
• 250-MHz Clock for High Bandwidth  
• 4-Word Burst for reducing address bus frequency  
• Double Data Rate (DDR) interfaces on both Read and  
Write Ports (data transferred at 500 MHz) at 250 MHz  
• Two input clocks (K and K) for precise DDR timing  
— SRAM uses rising edges only  
• Two output clocks (C and C) accounts for clock skew  
and flight time mismatching  
• Echo clocks (CQ and CQ) simplify data capture in high  
speed systems  
• Single multiplexed address input bus latches address  
inputs for both Read and Write ports  
• Separate Port Selects for depth expansion  
• Synchronous internally self-timed writes  
• Available in ×8,x9, ×18, and ×36 configurations  
• Full data coherency providing most current data  
• Core Vdd=1.8(+/-0.1V);I/O Vddq=1.4V to Vdd)  
• 15 × 17 x 1.4 mm 1.0-mm pitch FBGA package, 165-ball  
Depth expansion is accomplished with Port Selects for each  
(11 × 15 matrix)  
port. Port selects allow each port to operate independently.  
• Variable drive HSTL output buffers  
• JTAG 1149.1 Compatible test access port  
• Delay Lock Loop (DLL) for accurate data placement  
Configurations  
All synchronous inputs pass through input registers controlled  
by the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C input clocks. Writes are  
conducted with on-chip synchronous self-timed write circuitry.  
CY7C1511V18–8M x 8  
CY7C1526V18–8M x 9  
CY7C1513V18–4M x 18  
CY7C1515V18–2M x 36  
Cypress Semiconductor Corporation  
3901 North First Street  
San Jose, CA 95134  
408-943-2600  
Document #: 38-05363 Rev. *A  
Revised August 11, 2004  

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