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CY7C1513V18-278BZI PDF预览

CY7C1513V18-278BZI

更新时间: 2024-11-01 05:19:47
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
28页 460K
描述
72-Mbit QDR⑩- II SRAM 4-Word Burst Architecture

CY7C1513V18-278BZI 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:15 X 17 MM, 1.40 MM HEIGHT, MO-216, FBGA-165针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.92
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):278 MHzI/O 类型:SEPARATE
JESD-30 代码:R-PBGA-B165JESD-609代码:e0
长度:17 mm内存密度:75497472 bit
内存集成电路类型:QDR SRAM内存宽度:18
湿度敏感等级:3功能数量:1
端子数量:165字数:4194304 words
字数代码:4000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:4MX18输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):220电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最小待机电流:1.7 V子类别:SRAMs
最大压摆率:0.9 mA最大供电电压 (Vsup):1.9 V
最小供电电压 (Vsup):1.7 V标称供电电压 (Vsup):1.8 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:15 mmBase Number Matches:1

CY7C1513V18-278BZI 数据手册

 浏览型号CY7C1513V18-278BZI的Datasheet PDF文件第2页浏览型号CY7C1513V18-278BZI的Datasheet PDF文件第3页浏览型号CY7C1513V18-278BZI的Datasheet PDF文件第4页浏览型号CY7C1513V18-278BZI的Datasheet PDF文件第5页浏览型号CY7C1513V18-278BZI的Datasheet PDF文件第6页浏览型号CY7C1513V18-278BZI的Datasheet PDF文件第7页 
CY7C1511V18  
CY7C1526V18  
CY7C1513V18  
CY7C1515V18  
72-Mbit QDR™- II SRAM 4-Word Burst  
Architecture  
Features  
Functional Description  
• Separate Independent Read and Write Data Ports  
— Supports concurrent transactions  
The CY7C1511V18, CY7C1526V18, CY7C1513V18, and  
CY7C1515V18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with QDR-II architecture. QDR-II architecture  
consists of two separate ports to access the memory array.  
The Read port has dedicated Data Outputs to support Read  
operations and the Write Port has dedicated Data Inputs to  
support Write operations. QDR-II architecture has separate  
data inputs and data outputs to completely eliminate the need  
to “turn-around” the data bus required with common I/O  
devices. Access to each port is accomplished through a  
common address bus. Addresses for Read and Write  
addresses are latched on alternate rising edges of the input  
(K) clock. Accesses to the QDR-II Read and Write ports are  
completely independent of one another. In order to maximize  
data throughput, both Read and Write ports are equipped with  
Double Data Rate (DDR) interfaces. Each address location is  
associated with four 8-bit words (CY7C1511V18) or 9-bit  
words (CY7C1526V18) or 18-bit words (CY7C1513V18) or  
36-bit words (CY7C1515V18) that burst sequentially into or  
out of the device. Since data can be transferred into and out  
of the device on every rising edge of both input clocks (K and  
K and C and C), memory bandwidth is maximized while simpli-  
fying system design by eliminating bus “turn-arounds”.  
• 300-MHz Clock for High Bandwidth  
• 4-Word Burst for reducing address bus frequency  
• Double Data Rate (DDR) interfaces on both Read and  
Write Ports (data transferred at 600 MHz) at 300 MHz  
• Two input clocks (K and K) for precise DDR timing  
— SRAM uses rising edges only  
• Two input clocks for output data (C and C) to minimize  
clock-skew and flight-time mismatches  
• Echo clocks (CQ and CQ) simplify data capture in high  
speed systems  
• Single multiplexed address input bus latches address  
inputs for both Read and Write ports  
• Separate Port Selects for depth expansion  
• Synchronous internally self-timed writes  
• Available in x8, x9, x18, and x36 configurations  
• Full data coherency providing most current data  
• Core VDD = 1.8 (±0.1V); I/O VDDQ = 1.4V to VDD  
• Available in 165-ball FBGA package (15 x 17 x 1.4 mm)  
• Offered in both lead-free and non-lead free packages  
• Variable drive HSTL output buffers  
Depth expansion is accomplished with Port Selects for each  
port. Port selects allow each port to operate independently.  
All synchronous inputs pass through input registers controlled  
by the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
• JTAG 1149.1 Compatible test access port  
• Delay Lock Loop (DLL) for accurate data placement  
Configurations  
CY7C1511V18 – 8M x 8  
CY7C1526V18 – 8M x 9  
CY7C1513V18 – 4M x 18  
CY7C1515V18 – 2M x 36  
Selection Guide  
300 MHz  
300  
278 MHz  
250 MHz  
250  
200 MHz  
200  
167 MHz  
167  
Unit  
MHz  
mA  
Maximum Operating Frequency  
Maximum Operating Current  
278  
900  
950  
850  
750  
700  
Cypress Semiconductor Corporation  
Document #: 38-05363 Rev. *D  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised May 31, 2006  
[+] Feedback  

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