Datasheet > CY7C1510V18-200BZI

CY7C1510V18-200BZI

更新时间： 2024-11-24 05:19:43

品牌	Logo	应用领域
赛普拉斯 - CYPRESS		静态存储器
页数	文件大小	规格书
27页	489K
描述
72-Mbit QDR-II⑩ SRAM 2-Word Burst Architecture

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CY7C1510V18-200BZI 技术参数

是否无铅：	含铅	是否Rohs认证：	不符合
生命周期：	Obsolete	零件包装代码：	BGA
包装说明：	15 X 17 MM, 1.40 MM HEIGHT, MO-216, FBGA-165	针数：	165
Reach Compliance Code：	compliant	ECCN代码：	3A991.B.2.A
HTS代码：	8542.32.00.41	风险等级：	5.92
最长访问时间：	0.45 ns	其他特性：	PIPELINED ARCHITECTURE
最大时钟频率 (fCLK)：	200 MHz	I/O 类型：	SEPARATE
JESD-30 代码：	R-PBGA-B165	JESD-609代码：	e0
长度：	17 mm	内存密度：	67108864 bit
内存集成电路类型：	QDR SRAM	内存宽度：	8
湿度敏感等级：	3	功能数量：	1
端子数量：	165	字数：	8388608 words
字数代码：	8000000	工作模式：	SYNCHRONOUS
最高工作温度：	85 °C	最低工作温度：	-40 °C
组织：	8MX8	输出特性：	3-STATE
封装主体材料：	PLASTIC/EPOXY	封装代码：	LBGA
封装等效代码：	BGA165,11X15,40	封装形状：	RECTANGULAR
封装形式：	GRID ARRAY, LOW PROFILE	并行/串行：	PARALLEL
峰值回流温度（摄氏度）：	220	电源：	1.8 V
认证状态：	Not Qualified	座面最大高度：	1.4 mm
最小待机电流：	1.7 V	子类别：	SRAMs
最大供电电压 (Vsup)：	1.9 V	最小供电电压 (Vsup)：	1.7 V
标称供电电压 (Vsup)：	1.8 V	表面贴装：	YES
技术：	CMOS	温度等级：	INDUSTRIAL
端子面层：	Tin/Lead (Sn/Pb)	端子形式：	BALL
端子节距：	1 mm	端子位置：	BOTTOM
处于峰值回流温度下的最长时间：	NOT SPECIFIED	宽度：	15 mm
Base Number Matches：	1

CY7C1510V18-200BZI 数据手册

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CY7C1510V18

CY7C1525V18

CY7C1512V18

CY7C1514V18

72-Mbit QDR-II™ SRAM 2-Word Burst

Architecture

Features

Functional Description

• Separate Independent Read and Write Data Ports

— Supports concurrent transactions

• 250-MHz clock for high bandwidth

• 2-Word Burst on all accesses

The CY7C1510V18, CY7C1525V18, CY7C1512V18, and

CY7C1514V18 are 1.8V Synchronous Pipelined SRAMs,

equipped with QDR-II architecture. QDR-II architecture

consists of two separate ports to access the memory array.

The Read port has dedicated Data Outputs to support Read

operations and the Write Port has dedicated Data Inputs to

support Write operations. QDR-II architecture has separate

data inputs and data outputs to completely eliminate the need

to “turn-around” the data bus required with common I/O

devices. Access to each port is accomplished through a

common address bus. The Read address is latched on the

rising edge of the K clock and the Write address is latched on

• Double Data Rate (DDR) interfaces on both Read and

Write ports (data transferred at 500 MHz) @ 250 MHz

• Two input clocks (K and K) for precise DDR timing

— SRAM uses rising edges only

• Two input clocks for output data (C and C) to minimize

clock-skew and flight-time mismatches

the rising edge of the clock. Accesses to the QDR-II Read

and Write ports are completely independent of one another. In

order to maximize data throughput, both Read and Write ports

are equipped with Double Data Rate (DDR) interfaces. Each

address location is associated with two 8-bit words

(CY7C1510V18) or 9-bit words (CY7C1525V18) or 18-bit

words (CY7C1512V18) or 36-bit words (CY7C1514V18) that

burst sequentially into or out of the device. Since data can be

transferred into and out of the device on every rising edge of

both input clocks (K and K and C and C), memory bandwidth

is maximized while simplifying system design by eliminating

bus “turn-arounds.”

• Echo clocks (CQ and CQ) simplify data capture in high

speed systems

• Single multiplexed address input bus latches address

inputs for both Read and Write ports

• Separate Port Selects for depth expansion

• Synchronous internally self-timed writes

• Available in x8, x9, x18, and x36 configurations

• Full data coherency, providing most current data

• Core V_DD= 1.8V (±0.1V); I/O V_DDQ= 1.4V to V_DD

• Available in 165-ball FBGA package (15 x 17 x 1.4 mm)

• Offered in lead-free and non-lead free packages

• Variable drive HSTL output buffers

Depth expansion is accomplished with Port Selects for each

port. Port selects allow each port to operate independently.

All synchronous inputs pass through input registers controlled

by the K or K input clocks. All data outputs pass through output

registers controlled by the C or C (or K or K in a single clock

domain) input clocks. Writes are conducted with on-chip

synchronous self-timed write circuitry.

• JTAG 1149.1 compatible test access port

• Delay Lock Loop (DLL) for accurate data placement

Configurations

CY7C1510V18 – 8M x 8

CY7C1525V18 – 8M x 9

CY7C1512V18 – 4M x 18

CY7C1514V18 – 2M x 36

Selection Guide

250 MHz

200 MHz

200

167 MHz

167

Unit

MHz

Maximum Operating Frequency

Maximum Operating Current

250

950

850

800

Cypress Semiconductor Corporation

Document #: 38-05489 Rev. *D

•

198 Champion Court

•

San Jose, CA 95134-1709

•

408-943-2600

Revised May 31, 2006

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与CY7C1510V18-200BZI相关器件

型号	品牌	获取价格	描述	数据表
CY7C1510V18-200BZXC	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-200BZXI	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-250BZC	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-250BZI	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-250BZXC	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-250BZXI	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-278BZC	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-278BZI	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-278BZXC	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur
CY7C1510V18-278BZXI	CYPRESS	获取价格	72-Mbit QDR-II⑩ SRAM 2-Word Burst Architectur

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