CY7C13201KV18
18-Mbit DDR II SRAM 2-Word
Burst Architecture
Features
Functional Description
■ 18 Mbit Density (512K x 36)
The CY7C13201KV18 is 1.8V Synchronous Pipelined SRAM
equipped with DDR II architecture. The DDR II consists of an
SRAM core with advanced synchronous peripheral circuitry and
a 1-bit burst counter. Addresses for read and write are latched
on alternate rising edges of the input (K) clock. Write data is
registered on the rising edges of both K and K. Read data is
driven on the rising edges of C and C if provided, or on the rising
edge of K and K if C/C are not provided. The burst counter takes
in the least significant bit of the external address and bursts two
two 36-bit words sequentially into or out of the device.
■ 333 MHz Clock for High Bandwidth
■ 2-Word Burst to Reduce Address Bus Frequency
■ Double Data Rate (DDR) Interfaces
(data transferred at 666 MHz) at 333 MHz
■ Two Input Clocks (K and K) for Precise DDR Timing
❐ SRAM uses rising edges only
■ Two Input Clocks for Output Data (C and C) to minimize Clock
Skew and Flight Time Mismatches
Asynchronous inputs include an output impedance matching
input (ZQ). Synchronous data outputs (Q, sharing the same
physical pins as the data inputs D) are tightly matched to the two
output echo clocks CQ/CQ, eliminating the need for separately
capturing data from each individual DDR SRAM in the system
design. Output data clocks (C/C) enable maximum system
clocking and data synchronization flexibility.
■ Echo Clocks (CQ and CQ) simplify Data Capture in High Speed
Systems
■ Synchronous Internally Self Timed Writes
■ DDR II Operates with 1.5 Cycle Read Latency when DOFF is
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the C or C (or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
Asserted HIGH
■ Operates Similar to DDR I Device with 1 Cycle Read Latency
when DOFF is Asserted LOW
■ 1.8V Core Power Supply with HSTL Inputs and Outputs
■ Variable Drive HSTL Output Buffers
This device is down bonded from the 65 nm 72M QDRII device
and has the same IDD SB1 values and JTAG ID code as the
/I
equivalent 72M device option. For details refer to the application
note AN53189, 65 nm Technology Interim QDRII/DDRII SRAM
Device Family Description.
■ Expanded HSTL Output Voltage (1.4V–VDD
❐ Supports both 1.5V and 1.8V I/O supply
)
■ Available in 165-Ball FBGA Package (13 x 15 x 1.4 mm)
■ Offered in both Pb-free and Non Pb-free Packages
■ JTAG 1149.1 Compatible Test Access Port
■ Phase Locked Loop (PLL) for Accurate Data Placement
Configuration
CY7C13201KV18 – 512K x 36
Table 1. Selection Guide
Description
333 MHz
333
300 MHz
300
250 MHz
250
200 MHz
200
167 MHz
167
Unit
MHz
mA
Maximum Operating Frequency
Maximum Operating Current
640
600
530
450
400
Cypress Semiconductor Corporation
Document Number: 001-54142 Rev. *B
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised September 11, 2009
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