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CY7C1019BN PDF预览

CY7C1019BN

更新时间: 2022-04-23 23:00:11
品牌 Logo 应用领域
赛普拉斯 - CYPRESS /
页数 文件大小 规格书
8页 413K
描述
128K x 8 Static RAM

CY7C1019BN 数据手册

 浏览型号CY7C1019BN的Datasheet PDF文件第1页浏览型号CY7C1019BN的Datasheet PDF文件第2页浏览型号CY7C1019BN的Datasheet PDF文件第4页浏览型号CY7C1019BN的Datasheet PDF文件第5页浏览型号CY7C1019BN的Datasheet PDF文件第6页浏览型号CY7C1019BN的Datasheet PDF文件第7页 
CY7C1019BN  
AC Test Loads and Waveforms  
R1 480Ω  
ALL INPUT PULSES  
90%  
10%  
R1 480Ω  
5V  
5V  
OUTPUT  
3.0V  
GND  
90%  
10%  
OUTPUT  
R2  
255Ω  
R2  
255Ω  
30 pF  
5 pF  
3 ns  
3 ns  
INCLUDING  
JIG AND  
SCOPE  
INCLUDING  
JIG AND  
SCOPE  
(b)  
(a)  
Equivalent to: THÉVENIN EQUIVALENT  
167Ω  
1.73V  
OUTPUT  
Switching Characteristics[4] Over the Operating Range  
-12  
-15  
Parameter  
Description  
Min.  
12  
3
Max.  
Min.  
15  
3
Max.  
Unit  
Read Cycle  
tRC  
Read Cycle Time  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAA  
Address to Data Valid  
12  
15  
tOHA  
Data Hold from Address Change  
tACE  
LOW to Data Valid  
LOW to Data Valid  
LOW to Low Z  
HIGH to High Z[5, 6]  
LOW to Low Z[6]  
HIGH to High Z[5, 6]  
LOW to Power-Up  
HIGH to Power-Down  
12  
6
15  
7
CE  
OE  
OE  
OE  
CE  
CE  
CE  
CE  
tDOE  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
tPU  
0
3
0
0
3
0
6
6
7
7
tPD  
12  
15  
Write Cycle[7, 8]  
tWC  
Write Cycle Time  
LOW to Write End  
12  
9
15  
10  
10  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tSCE  
CE  
tAW  
Address Set-Up to Write End  
Address Hold from Write End  
Address Set-Up to Write Start  
8
tHA  
0
tSA  
0
0
tPWE  
tSD  
Pulse Width  
8
10  
8
WE  
Data Set-Up to Write End  
6
tHD  
Data Hold from Write End  
HIGH to Low Z[6]  
WE  
0
0
tLZWE  
3
3
tHZWE  
LOW to High Z[5, 6]  
6
7
WE  
Notes:  
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified  
I
/I and 30-pF load capacitance.  
OL OH  
5. t  
, t  
, and t  
are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.  
HZOE HZCE  
HZWE  
6. At any given temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any given device.  
HZCE  
LZCE HZOE  
LZOE  
HZWE  
LZWE  
7. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. CE and WE must be LOW to initiate a write, and the transition of any  
of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.  
8. The minimum write cycle time for Write Cycle no. 3 (WE controlled, OE LOW) is the sum of t  
and t  
.
SD  
HZWE  
Document #: 001-06425 Rev. **  
Page 3 of 8  

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