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CUS06 PDF预览

CUS06

更新时间: 2024-11-09 12:50:55
品牌 Logo 应用领域
东芝 - TOSHIBA 电池开关便携式便携式设备
页数 文件大小 规格书
5页 174K
描述
Switching Mode Power Supply Applications Portable Equipment Battery Application

CUS06 技术参数

生命周期:End Of Life包装说明:R-PDSO-F2
针数:2Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.10.00.80
风险等级:5.7外壳连接:CATHODE
配置:SINGLE二极管元件材料:SILICON
二极管类型:RECTIFIER DIODEJESD-30 代码:R-PDSO-F2
元件数量:1端子数量:2
最高工作温度:150 °C最低工作温度:-40 °C
最大输出电流:1 A封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
认证状态:Not Qualified最大重复峰值反向电压:20 V
表面贴装:YES技术:SCHOTTKY
端子形式:FLAT端子位置:DUAL
Base Number Matches:1

CUS06 数据手册

 浏览型号CUS06的Datasheet PDF文件第2页浏览型号CUS06的Datasheet PDF文件第3页浏览型号CUS06的Datasheet PDF文件第4页浏览型号CUS06的Datasheet PDF文件第5页 
CUS06  
TOSHIBA Schottky Barrier Rectifier Schottky Barrier Type  
CUS06  
Switching Mode Power Supply Applications  
Portable Equipment Battery Application  
Unit: mm  
+ 0.2  
0.1  
1.25  
+ 0.05  
0.13  
0.88 ± 0.1  
0.03  
Forward voltage: V  
= 0.45 V (max) @I = 0.7 A  
FM F  
Average forward current: I  
= 1.0 A  
F (AV)  
Repetitive peak reverse voltage: V  
= 20 V  
RRM  
Suitable for high-density board assembly due to the use of a small  
Surface-mount package, USFLATTM  
0.6 ± 0.1  
0.88 ± 0.1  
Absolute Maximum Ratings (Ta = 25°C)  
0.6 ± 0.1  
Characteristics  
Symbol  
Rating  
Unit  
Repetitive peak reverse voltage  
Average forward current  
Peak one cycle surge forward current  
(Non-repetitive)  
V
20  
V
A
RRM  
1.0 (Note 1)  
0.78 ± 0.1  
I
F (AV)  
ANODE  
CATHODE  
I
20 (50 Hz)  
A
FSM  
0.6 ± 0.1  
Junction temperature  
T
40 to 150  
40 to 150  
°C  
°C  
j
JEDEC  
Storage temperature range  
T
stg  
JEITA  
Note 1: Ta = 66°C: Device mounted on a glass-epoxy board  
(Board size: 50 mm × 50 mm,  
TOSHIBA  
3-2B1A  
Soldering land: 6 mm × 6 mm)  
Rectangular waveform (α = 180°), V = 10 V  
Weight: 0.004 g (typ.)  
R
Note 2: Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to  
decrease in the reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2010-02-01  

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