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CD4511BPWE4 PDF预览

CD4511BPWE4

更新时间: 2024-11-21 12:33:07
品牌 Logo 应用领域
德州仪器 - TI 驱动器逻辑集成电路光电二极管
页数 文件大小 规格书
15页 1083K
描述
CMOS BCD-to-7 Segment Latch Decoder Drivers

CD4511BPWE4 数据手册

 浏览型号CD4511BPWE4的Datasheet PDF文件第2页浏览型号CD4511BPWE4的Datasheet PDF文件第3页浏览型号CD4511BPWE4的Datasheet PDF文件第4页浏览型号CD4511BPWE4的Datasheet PDF文件第5页浏览型号CD4511BPWE4的Datasheet PDF文件第6页浏览型号CD4511BPWE4的Datasheet PDF文件第7页 
Lamp Test (LT), Blanking (BL), and Latch  
Enable or Strobe inputs are provided to test  
the display, shut off or intensity-modulate it,  
andstoreorstrobeaBCDcode,respectively.  
Severaldifferentsignalsmaybemultiplexed  
and displayed when external multiplexing  
circuitry is used.  
The CD4511B types are supplied in 16-lead  
hermetic dual-in-line ceramic packages  
(F3A suffix), 16-lead dual-in-line plastic  
packages (E suffix), 16-lead small-outline  
packages (NSR suffix), and 16-lead thin  
shrinksmall-outlinepackages(PWandPWR  
suffixes).  
These devices are similar to the type  
MC14511.  
Copyright 2003, Texas Instruments Incorporated  

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