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CD4093BMJ/883 PDF预览

CD4093BMJ/883

更新时间: 2024-11-04 20:29:55
品牌 Logo 应用领域
德州仪器 - TI 输入元件逻辑集成电路触发器
页数 文件大小 规格书
8页 21K
描述
4000/14000/40000 SERIES, QUAD 2-INPUT NAND GATE, CDIP14

CD4093BMJ/883 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DIP, DIP14,.3Reach Compliance Code:compliant
HTS代码:8542.39.00.01风险等级:5.43
系列:4000/14000/40000JESD-30 代码:R-GDIP-T14
JESD-609代码:e0长度:19.43 mm
负载电容(CL):50 pF逻辑集成电路类型:NAND GATE
功能数量:4输入次数:2
端子数量:14最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装等效代码:DIP14,.3
封装形状:RECTANGULAR封装形式:IN-LINE
峰值回流温度(摄氏度):NOT SPECIFIED电源:5/15 V
Prop。Delay @ Nom-Sup:840 ns传播延迟(tpd):840 ns
认证状态:Not Qualified施密特触发器:YES
筛选级别:MIL-STD-883座面最大高度:5.08 mm
子类别:Gates最大供电电压 (Vsup):15 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:7.62 mmBase Number Matches:1

CD4093BMJ/883 数据手册

 浏览型号CD4093BMJ/883的Datasheet PDF文件第2页浏览型号CD4093BMJ/883的Datasheet PDF文件第3页浏览型号CD4093BMJ/883的Datasheet PDF文件第4页浏览型号CD4093BMJ/883的Datasheet PDF文件第5页浏览型号CD4093BMJ/883的Datasheet PDF文件第6页浏览型号CD4093BMJ/883的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/12/95  
Last Update Date: 09/29/03  
MNCD4093BM-X REV 1B0  
Last Major Revision Date: 03/05/98  
QUAD 2-INPUT NAND SCHMITT TRIGGER  
General Description  
The CD4093B consists of four Schmitt-trigger circuits. Each circuit functions as a 2-input  
NAND gate with Schmitt-trigger action on both inputs. The gate switches at different  
points for positive and negative-going signals. The difference between the positive (Vt+)  
and the negative voltage (Vt-) is defined as hysteresis voltage (Vh).  
All outputs have equal source and sink currents and conform to standard B-series output  
drive (See Static Electrical Characteristics).  
Industry Part Number  
NS Part Numbers  
CD4093BM  
CD4093BMJ/883*  
Prime Die  
CD4093BM  
Controlling Document  
7704601CA*  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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