CD4029BMS
CMOS Presettable Up/Down Counter
December 1992
Features
Description
• High-Voltage Type (20V Rating)
CD4029BMS consists of a four-stage binary or BCD-decade up/
• Medium Speed Operation: 8MHz (Typ.) at CL = 50pF down counter with provisions for look-ahead carry in both count-
and VDD - VSS = 10V
ing modes. The inputs consist of a single CLOCK, CARRY-IN
(CLOCK ENABLE), BINARY/DECADE, UP/DOWN, PRESET
ENABLE, and four individual JAM signals. Q1, Q2, Q3, Q4 and a
CARRY OUT signal are provided as outputs.
• Multi-Package Parallel Clocking for Synchronous High
Speed Output Response or Ripple Clocking for Slow
Clock Input Rise and Fall Times
A high PRESET ENABLE signal allows information on the JAM
INPUTS to preset the counter to any state asynchronously with
the clock. A low on each JAM line, when the PRESET-ENABLE
signal is high, resets the counter to its zero count. The counter is
advanced one count at the positive transition of the clock when
the CARRY-IN and PRE-SET ENABLE signals are low.
Advancement is inhibited when the CARRY-IN or PRESET
ENABLE signals are high. The CARRY-OUT signal is normally
high and goes low when the counter reaches its maximum count
in the UP mode or the minimum count in the DOWN mode pro-
vided the CARRY-IN signal is low. The CARRY-IN signal in the
low state can thus be considered a CLOCK ENABLE. The
CARRY-IN terminal must be connected to VSS when not in use.
• “Preset Enable” and Individual “Jam” Inputs Provided
• Binary or Decade Up/Down Counting
• BCD Outputs in Decade Mode
• 100% Tested for Maximum Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Standardized Symmetrical Output Characteristics
• Maximum Input Current of 1µA at 18V Over Full Pack-
age-Temperature Range; 100nA at 18V and +25oC
• Noise Margin (Over Full Package Temperature Range):
- 1V at VDD = 5V
- 2V at VDD = 10V
Binary counting is accomplished when the BINARY/DECADE
input is high; the counter counts in the decade mode when the
BINARY/DECADE input is low. The counter counts up when the
UP/DOWN input is high, and down when the UP/DOWN input is
low. Multiple packages can be connected in either a parallel-
clocking or a ripple-clocking arrangement as shown in Figure 17.
- 2.5V at VDD = 15V
• Meets All Requirements of JEDEC Tentative Stan-
dards No. 13B, “Standard Specifications for Descrip-
tion of “B” Series CMOS Device’s
Applications
Parallel clocking provides synchronous control and hence faster
response from all counting outputs. Ripple-clocking allows for
longer clock input rise and fall times.
• Programmable Binary and Decade Counting/Fre-
quency Synthesizers-BCD Output
• Analog to Digital and Digital to Analog Conversion
• Up/Down Binary Counting
The CD4029BMS is supplied in these 16-lead outline packages:
Braze Seal DIP
Frit Seal DIP
H4X
H1F
• Difference Counting
Ceramic Flatpack H6W
• Magnitude and Sign Generation
• Up/Down Decade Counting
Functional Diagram
Pinout
CD4029BMS
TOP VIEW
JAM INPUTS
PRESET
ENABLE
VDD
16
1
2
3
4
CARRY IN
(CLOCK
ENABLE)
PRESET ENABLE
Q4
1
2
3
4
5
6
7
8
16 VDD
1
4 12 13 3
Q1
6
5
9
15 CLOCK
14 Q3
JAM 4
Q2
Q3
Q4
BINARY/
DECADE
11
JAM 1
13 JAM 3
12 JAM 2
11 Q2
CARRY IN
Q1
BUFFERED
OUTPUTS
14
UP/DOWN 10
10 UP/DOWN
CARRY OUT
VSS
2
7
9
BINARY/DECADE
CLOCK
15
CARRY
OUT
8
VSS
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
File Number 3304
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7-798