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CD4029BMW PDF预览

CD4029BMW

更新时间: 2024-09-22 23:40:23
品牌 Logo 应用领域
其他 - ETC 计数器
页数 文件大小 规格书
7页 21K
描述
Synchronous Up/Down Counter

CD4029BMW 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/10/95  
Last Update Date: 05/14/98  
MNCD4029BM-X REV 1A0  
Last Major Revision Date: 03/04/98  
PRESETTABLE BINARY/DECADE UP/DOWN COUNTER  
General Description  
The CD4029BM is a presettable up/down counter which counts in either binary or decade mode  
depending on the voltage level applied at binary/decade input. When binary/decade is at  
logical "1", the counter counts in binary, otherwise it counts in decade. Similarly, the  
counter counts up when the up/down input is at logical "1" and vice versa.  
A Logical "1" preset enable signal allows information at the "jam" inputs to preset the  
counter to any state asynchronously with the clock. The counter is advanced one count at  
the positive-going edge of the clock if the carry in and preset enable inputs are at  
logical "0". Advancement is inhibited when either or both of these two inputs is at  
logical "1". The carry out signal is normally at logical "1" state and goes to logical "0"  
state when the counter reaches its maximum count in the "up" mode or the minimum count in  
the "down" mode provided the carry input is at logical "0" state.  
All inputs are protected against static discharge by diode clamps to both Vdd and Vss.  
Industry Part Number  
NS Part Numbers  
CD4029BM  
CD4029BMJ/883*  
CD4029BMW/883  
Prime Die  
CD4029BM  
Controlling Document  
8101601EA*  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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