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BCW29_98

更新时间: 2024-11-07 08:50:47
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KEC /
页数 文件大小 规格书
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描述
SOT-23 PACKAGE

BCW29_98 数据手册

  
SEMICONDUCTOR  
MARKING SPECIFICATION  
BCW29  
SOT-23 PACKAGE  
1. Marking method  
Laser Marking  
2. Marking  
2
1
C1  
No.  
Item  
Marking  
Description  
Device Mark  
hFE Grade  
C1  
-
BCW29  
-
1998. 1st Week  
[0:1st Character, 1:2nd Character]  
* Lot No.  
01  
Note) * Lot No. marking method  
1
(A)  
2
(B)  
3
(C)  
4
(D)  
5
(E)  
6
(F)  
7
(G)  
8
(H)  
9
(I)  
0
(J)  
1 st Character  
Character  
arrangement  
A
(1)  
B
(2)  
C
(3)  
D
(4)  
E
(5)  
F
(6)  
G
(7)  
H
(8)  
I
(9)  
J
(0)  
2nd Character  
Year  
Marking (Week)  
Periode (Year)  
Remark  
1 st Year (1998)  
2 nd Year (1999)  
3 rd Year (2000)  
4 th Year (2001)  
01  
0A  
J1  
02  
51  
52  
5B  
E2  
EB  
1998-2002-2006-2010...  
1999-2003-2007-2011...  
2000-2004-2008-2012...  
2001-2005-2009-2013...  
0B  
J2  
5A  
E1  
Rotation for 4 years  
JA  
JB  
EA  
1998. 9. 4  
Revision No : 0  
1/1  

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