ATF-551M4 Electrical Specifications
TA = 25°C, RF parameters measured in a test circuit for a typical device
Symbol
Parameter and Test Condition
Units
Min.
Typ.
Max.
Vgs
Vth
Idss
Gm
Operational Gate Voltage
Threshold Voltage
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 2 mA
Vds = 2.7V, Vgs = 0V
V
0.3
0.47
0.37
0.1
0.65
0.53
3
V
0.18
—
Saturated Drain Current
Transconductance
µA
Vds = 2.7V, gm = ∆Idss/∆Vgs;
∆Vgs = 0.75 –0.7 = 0.05V
mmho
110
220
285
Igss
NF
Gate Leakage Current
Vgd = Vgs = -2.7V
µA
—
—
95
Noise Figure[1]
f = 2 GHz
Vds = 2.7V, Ids = 10 mA
Vds = 3V, Ids = 20 mA
dB
dB
—
—
0.5
0.5
0.9
—
Gain
Gain [1]
f = 2 GHz
f = 2 GHz
f = 2 GHz
Vds = 2.7V, Ids = 10 mA
Vds = 3V, Ids = 20 mA
dB
dB
15.5
—
17.5
18.0
18.5
—
OIP3
Output 3rd Order
Intercept Point[1]
Vds = 2.7V, Ids = 10 mA
Vds = 3V, Ids = 20 mA
dBm
dBm
22
—
24.1
30.0
—
—
P1dB
Notes:
1dB Compressed
Output Power[1]
Vds = 2.7V, Ids = 10 mA
Vds = 3V, Ids = 20 mA
dBm
dBm
—
—
14.6
16.0
—
—
1. Measurements obtained using production test board described in Figure 5. Typical values were determined from a sample size of 398 parts from
4 wafers.
50Ω Input
Transmission
Line Including
Gate Bias T
(0.3 dB loss)
Input
Output
50Ω Output
Transmission
Line Including
Gate Bias T
Input
Output
Matching Circuit
Γ_mag = 0.3
Γ_ang = 11°
(0.3 dB loss)
Matching Circuit
Γ_mag = 0.3
Γ_ang = 9°
DUT
(0.9 dB loss)
(0.3 dB loss)
Figure 5. Block diagram of 2 GHz production test board used for Noise Figure, Gain, P1dB, OIP3, and IIP3 measurements. This circuit represents a
trade-off between an optimal noise match, maximum OIP3 match and associated impedance matching circuit losses. Circuit losses have been de-
embedded from actual measurements.
ATF-551M4 Electrical Specifications (see notes 2 and 3, as indicated)
Symbol
Parameter and Test Condition
Units
Min.
Typ.
Max.
Fmin
Minimum Noise Figure[2] f = 900 GHz
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
dB
dB
dB
dB
—
—
—
—
0.27
0.41
0.61
0.88
—
—
—
—
f = 2 GHz
f = 3.9 GHz
f = 5.8 GHz
Ga
Associated Gain [2]
f = 900 GHz
f = 2 GHz
f = 3.9 GHz
f = 5.8 GHz
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
dB
dB
dB
dB
—
—
—
—
21.8
17.9
14.2
12.0
—
—
—
—
OIP3
Output 3rd Order
Intercept Point[3]
f = 900 GHz
f = 3.9 GHz
f = 5.8 GHz
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
dBm
dBm
dBm
—
—
—
22.1
24.3
24.5
—
—
—
P1dB
1dB Compressed
Output Power[3]
f = 900 GHz
f = 3.9 GHz
f = 5.8 GHz
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
dBm
dBm
dBm
—
—
—
14.3
14.5
14.3
—
—
—
Notes:
2. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these
measurements Fmin is calculated. Refer to the noise parameter measurement section for more information.
3. Measurements taken above and below 2 GHz was made using a double stub tuner at the input tuned for low noise and a double stub tuner at the
output tuned for maximum OIP3. Circuit losses have been de-embedded from actual measurements.
3