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AS4LC4M4E0 PDF预览

AS4LC4M4E0

更新时间: 2022-01-22 08:55:00
品牌 Logo 应用领域
其他 - ETC 动态存储器
页数 文件大小 规格书
15页 266K
描述
4M x 4 CMOS DRAM (EDO) Family

AS4LC4M4E0 数据手册

 浏览型号AS4LC4M4E0的Datasheet PDF文件第5页浏览型号AS4LC4M4E0的Datasheet PDF文件第6页浏览型号AS4LC4M4E0的Datasheet PDF文件第7页浏览型号AS4LC4M4E0的Datasheet PDF文件第9页浏览型号AS4LC4M4E0的Datasheet PDF文件第10页浏览型号AS4LC4M4E0的Datasheet PDF文件第11页 
AS4LC4M4E0  
AS4LC4M4E1  
®
Notes  
1
2
3
I
, I , I , and I  
are dependent on frequency.  
CC6  
CC1 CC3 CC4  
I
and I  
depend on output loading. Specified values are obtained with the output open.  
CC4  
CC1  
An initial pause of 200 µs is required after power-up followed by any 8 RAS cycles before proper device operation is achieved. In the case of an internal  
refresh counter, a minimum of 8 CAS-before-RAS initialization cycles instead of 8 RAS cycles are required. 8 initialization cycles are required after  
extended periods of bias without clocks (greater than 8 ms).  
4
5
6
AC Characteristics assume t = 2 ns. All AC parameters are as described in AC test conditions below  
T
V
(min) and V (max) are reference levels for measuring timing of input signals. Transition times are measured between V and V .  
IH  
IL  
IH  
IL  
Operation within the t  
(max) limit insures that t  
(max) can be met. t  
(max) is specified as a reference point only. If t  
is greater than the  
RCD  
RAC  
RCD  
RCD  
specified t  
(max) limit, then access time is controlled exclusively by t  
.
RCD  
CAC  
7
Operation within the t  
(max) limit insures that t  
(max) can be met. t  
(max) is specified as a reference point only. If t  
is greater than the  
RAD  
RAC  
RAD  
RAD  
specified t  
(max) limit, then access time is controlled exclusively by t .  
AA  
RAD  
8
Assumes three state test load (5 pF and a 380 Thevenin equivalent).  
Either t or t must be satisfied for a read cycle.  
9
RCH  
RRH  
10  
t
(max) defines the time at which the output achieves the open circuit condition; it is not referenced to output voltage levels. t  
is referenced from  
OFF  
OFF  
rising edge of RAS or CAS, whichever occurs last.  
t , t , t , t and t are not restrictive operating parameters. They are included in the datasheet as electrical characteristics only.  
WCS WCH RWD CWD  
11  
AWD  
If tWS t (min) and tWH t (min), the cycle is an early write cycle and data out pins will remain open circuit, high impedance, throughout the  
WS  
WH  
cycle. If tRWD t  
(min), t  
t  
(min) and tAWD t  
(min), the cycle is a read-write cycle and the data out will contain data read from the  
RWD  
CWD  
CWD  
AWD  
selected cell. If neither of the above conditions is satisfied, the condition of the data out at access time is indeterminate.  
12 These parameters are referenced to CAS leading edge in early write cycles and to WE leading edge in read-write cycles.  
13 Access time is determined by the longest of t or t or t  
CAA  
CAC  
CPA  
14  
t
ASC t to achieve t (min) and t  
(max) values.  
CPA  
CP  
PC  
15 These parameters are sampled and not 100% tested.  
AC test conditions  
- Access times are measured with output reference levels of V  
=
OH  
2.4V and V = 0.4V,  
OL  
V
= 2.0V and V = 0.8V  
IL  
IH  
- Input rise and fall times: 2 ns  
+3.3V  
R1 = 828Ω  
Dout  
50 pF*  
R2 = 295Ω  
*including scope  
and jig capacitance  
GND  
Figure B: Equivalent output load  
(AS4LC4M4E0)  
(AS4LC4M4E1)  
4/11/01; V.1.1  
Alliance Semiconductor  
P. 8 of 15  

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