Table 5. Electrical Characteristics (T = 25C unless otherwise noted) (continued)
A
Characteristic
Symbol
Min
Typ
= 860 mA, V = 0.9 Vdc,
GSB
Max
Unit
(1,2,3)
Functional Tests
(In Freescale Doherty Test Fixture, 50 ohm system) V = 48 Vdc, I
DD
DQA
P
= 100 W Avg., f = 920 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF.
out
ACPR measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset.
Power Gain
G
18.5
45.0
6.6
19.5
48.5
7.2
21.5
—
dB
%
ps
D
Drain Efficiency
Output Peak--to--Average Ratio @ 0.01% Probability on CCDF
Adjacent Channel Power Ratio
PAR
—
dB
dBc
ACPR
—
–29.2
–27.0
Load Mismatch (In Freescale Test Fixture, 50 ohm system) I
= 860 mA, V
= 0.9 Vdc, f = 940 MHz
GSB
DQA
VSWR 10:1 at 52 Vdc, 500 W Pulsed Output Power
(3 dB Input Overdrive from 200 W Pulsed Rated Power)
No Device Degradation
(2)
Typical Performances (In Freescale Doherty Test Fixture, 50 ohm system) V = 48 Vdc, I
= 860 mA, V
= 0.9 Vdc, 920--960 MHz
GSB
DD
DQA
Bandwidth
P
P
@ 1 dB Compression Point, CW
P1dB
P3dB
—
200
500
–21
—
—
—
W
W
out
out
(4)
@ 3 dB Compression Point
—
—
AM/PM
(Maximum value measured at the P3dB compression point across
the 920--960 MHz frequency range)
VBW Resonance Point
VBW
—
43
—
MHz
res
(IMD Third Order Intermodulation Inflection Point)
Gain Flatness in 40 MHz Bandwidth @ P = 100 W Avg.
G
—
—
0.3
—
—
dB
out
F
Gain Variation over Temperature
G
0.01
dB/C
(--30C to +85C)
Output Power Variation over Temperature
P1dB
—
0.0075
—
dB/C
(--30C to +85C)
1. Part internally input matched.
2. Measurement made with device in a symmetrical Doherty configuration.
3. Measurement made with device in straight lead configuration before any lead forming operation is applied.
4. P3dB = P + 7.0 dB where P is the average output power measured using an unclipped W--CDMA single--carrier input signal where
avg
avg
output PAR is compressed to 7.0 dB @ 0.01% probability on CCDF.
AFV09P350--04NR3 AFV09P350--04GNR3
RF Device Data
Freescale Semiconductor, Inc.
3