ADS54T04
www.ti.com
SLAS917 –DECEMBER 2012
Dual Channel 12-Bit 500Msps Receiver and Feedback IC
Check for Samples: ADS54T04
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FEATURES
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Power Dissipation: 800mW/ch
Performance at fin = 230 MHz IF
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Dual Channel
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SNR: 60.6 dBFS
SFDR: 77 dBc
12-Bit Resolution
Maximum Clock Rate: 500 Msps
Low Swing Fullscale Input: 1.0 Vpp
Analog Input Buffer with High Impedance Input
Input Bandwidth (3dB): >1.2GHz
Data Output Interface: DDR LVDS
196-Pin BGA Package (12x12mm)
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Performance at fin = 700 MHz IF
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SNR: 59.4 dBFS
SFDR: 70 dBc
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Receive Mode: 2x Decimation with Low Pass
or High Pass Filter
Feedback Mode: Burst Mode Output for Full
Bandwidth DPD Feedback
Number of
Channels
Device Part No.
Speed Grade
ADS54T02
ADS54T01
ADS54T04
2
1
2
750Msps
750Msps
500Msps
APPLICATIONS
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Telecommunications Receiver
Power Amplifier Linearization
DESCRIPTION
The ADS54T04 is a high linearity dual channel 12-bit, 500 MSPS analog-to-digital converter (ADC) easing front
end filter design for wide bandwidth receivers. The analog input buffer isolates the internal switching of the on-
chip track-and-hold from disturbing the signal source as well as providing a high-impedance input. Two output
modes are available for the output data – it can be decimated by two or the data can be output in burst mode.
The burst mode output is designed specifically for DPD feedback applications where high resolution output data
is available for a short period of time. Designed for high SFDR, the ADC has low-noise performance and
outstanding spurious-free dynamic range over a large input-frequency range. The device is available in a 196pin
BGA package and is specified over the full industrial temperature range (–40°C to 85°C).
Digital Block
12bit
500Msps
Burst Mode
INA
DA[11:0]
DACLK
2x Decimation
Clk
Buffer
CLKIN
SYNC
TRIGGER
Digital Block
Burst Mode
12bit
500Msps
INB
DB[11:0]
DBCLK
2x Decimation
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated