Datasheet > ADS131E04_14

ADS131E04_14

更新时间： 2022-10-12 16:27:11

品牌	Logo	应用领域
德州仪器 - TI		监控
页数	文件大小	规格书
60页	1805K
描述
Analog Front-End for Power Monitoring, Control, and Protection

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ADS131E04_14 数据手册

ADS131E04

ADS131E06

ADS131E08

SBAS561A –JUNE 2012–REVISED APRIL 2013

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FAMILY AND ORDERING INFORMATION⁽¹⁾

OPERATING

NUMBER OF

CHANNELS

MAXIMUM SAMPLE

RATE (kSPS)

TEMPERATURE

RANGE

PRODUCT

ADS130E08

ADS131E04

ADS131E06

ADS131E08

PACKAGE OPTION

TQFP-64

ACCURACY

Class 1.0

Class 0.1

–40°C to +105°C

TQFP-64

(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS⁽¹⁾

Over operating free-air temperature range, unless otherwise noted.

VALUE

UNIT

AVDD to AVSS

–0.3 to +5.5

DVDD to DGND

–0.3 to +3.9

Analog input to AVSS

Digital input to DVDD

AVSS – 0.3 to AVDD + 0.3

DGND – 0.3 to DVDD + 0.3

Input current to any pin except supply pins⁽²⁾

±10

±100

°C

Momentary

Input current

Continuous

±10

Operating, industrial-grade devices only

Storage

–40 to +85

–60 to +150

+150

Temperature

Maximum junction, T_J

Human body model (HBM)

JEDEC standard 22, test method A114-C.01, all pins

±1000

±500

Electrostatic discharge

(ESD) ratings

Charged device model (CDM)

JEDEC standard 22, test method C101, all pins

(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing beyond the supply rails must be current limited

to 10 mA or less.

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